Tamazaki spot NITTOSEIKO Nitto Seiko low resistivity meter

NegotiableUpdate on 05/06

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

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Overview

Tamazaki Spot NITTOSEIKO Nitto Precision Low resistivity Meter $r $nLoresta-GXII is a measuring instrument for measuring resistivity, which is one of the evaluation criteria for materials.

Product Details

Tamazaki spot NITTOSEIKO Nitto Seiko low resistivity meter

purpose

Loresta GXII is a measuring instrument for measuring electrical resistivity, which is one of the evaluation criteria for materials.

With the development of science and technology, there is an increasing need for easy, fast, increasingly strict, and high-precision management of materials in areas such as research and development, production technology, and quality control. Among them, resistivity (surface, volume, conductivity) is an indicator that represents the state and properties of materials. Loresta GXII is a device that can easily and accurately measure resistivity using correction coefficients.

This device adopts a measurement method that complies with JIS K 7194 and can use various probes to measure various materials such as conductive plastics, ITO films, and silicon chips.

Unlike the traditional 4-terminal method, there is no need to prepare electrodes for the measurement object. Various 4-point probes provided by our company can be used to measure resistivity with just one click.

Main measurement targets

Conductive plastics, electromagnetic shielding materials, silicon wafers, conductive rubber
Conductive coatings, pastes, inks, metal films, ITO glass, films, etc.

feature

Surface resistivity, volume resistivity (specific resistance), and conductivity of low resistance areas can be measured with high precision anytime and anywhere.

andLoresta GP-3Up to 107）Compared to, the measurement range ranges from 10-4Expand to 107 Ω
By changing the direction of the current, silicon wafers can be measured
Constant current variable function (can use small currents for sample measurement)
Can output 2000 measurement results to USB memory
Improve operability through touch screen

option

The GX probe cannot be connected to GXII.

Name/Product AbbreviationGX uses ASP probe RMH110
， GX II uses GPASR probeRMH501

specification
Complies with JIS K 7194
Pin spacing: 5mm
Pin tip: 0.37R x 4 pieces
Spring pressure: 220 grams per piece
Application Characteristicsincluding
Conductive plastics, conductive coatings, films, etc.The standard probe is compatible with JIS K7194.

Name/Product Abbreviation

ESP probe RMH114for GX,GP
ESR probe
RMH502 for GXⅡ

specification
Pin to pin: 5mm
Pin tip: φ 2mm x 4
Spring pressure: 230g/piece
application
Heterogeneous samples, such as conductive plastics mixed with carbon powder, metal powder, etc. (especially injection molded products)
characteristic
The diameter of the pin tip is 2 mm, and due to its surface shape, the applied current easily flows.

Name/Product Abbreviation

GX uses LSP probe RMH116， GX II uses GP
LSR probe
RMH503

specification
Pin spacing: 5mm
Pin tip: ball D2mm x 4 pieces Spring pressure:140g
/Item
application
Conductive rubber and film, etcSoft samples are difficult to get stuck in rubber.

Name/Product Code

PSP probe RMH112for GX,GP
PSR probe
RMH504 for GXⅡ

specification
Pin spacing: 1.5mm Pin tip
：0.26R x 4
Spring pressure: 95g/piece
application
Thin film, small sample, narrow space
characteristic
The film uses standard probes with very thin pins and a distance of 1.5 mm between the pins.

Name/Product Abbreviation

GX uses QP2 probe RMH119， GX II uses GP
QR probe
RMH505

specification
Pin to Pin: 1.5mm
Needle tip: 0.26R x 4
Spring pressure: 95g/piece
applicationSquare, especiallyApplicable to
Small samples and narrow spaces.The resistance value is about half of a 4-pin series pin, and handheld devices cannot support correction factors, so it is not recommended to use it.

Name/Product Abbreviation

GX uses BSP probe RMH111， GX II uses GP
BSR probe
RMH506

specification
Pin spacing: 2.5mm
Pin tip: 0.37R x 4
Spring pressure: 170g/pin
Application:
Measurement between two distant points, measurement between the front and rear surfaces (interlayer resistance)
4 of them
The pins are divided into 2, and measured like a tester with one in the right hand and one in the left hand. As for the host, GXII is more convenient because it can use a foot switch.

Note that resistivity cannot be measured.

Name/Product Abbreviation

GX uses NSCP probe RMJ202， GX II uses GP
NSCR probe
RMH507

specification
Pin spacing: 1.0mm
Pin tip: 0.04R x 4 pieces
Spring pressure: 250g/piece only
Suitable for silicon wafers,Applicable to
Samples with a hard and smooth surface, such as ceramicsThe pin material is tungsten carbide, sharp and sturdy, with strong spring pressure.

Name/Product Abbreviation
TFP probe
RMJ217 for GX (sold out)

specification
Pin to pin: 1.0mm
Pin tip: 0.15R x 4
Spring pressure: 50g/piece
application
Silicon wafers or thin films used on glass substrates

Name/Product Code
AP2 probe
RMH333 for GX,GP
AR probe
RMH508 for GXⅡ

specification
Pin to pin: 10mm
Pin tip φ 2 x 2
Spring pressure: 230g/pin
application
Used for surface treatment of chemical conversion coatings on steel plates and magnesium alloys
use
Measurement using the 2-terminal method, including contact resistance, results in higher resistance values. Due to incorrect resistance values, we will not convert them into electrical resistivity. Mainly used for qualitative evaluation.
Note that resistivity cannot be measured.

Name/Product Abbreviation

GX uses BP probe RMH118， GX II uses GP
BR probe
RMH509

specification
Needle tip: φ 2 x 2
Spring pressure: 200g/needle
purpose
2-point probe
Used for measuring between two distant points on chemical conversion coatings such as steel plates and magnesium alloys for surface treatmentUsed for using 2 terminals
lawNote that resistivity cannot be measured.