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Beijing Chuangheng Kejie Technology Co., Ltd
TM4000 desktop electron microscope
NegotiableUpdate on 05/07
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Overview
The low vacuum system of TM4000 desktop electron microscope enables rapid observation of samples without any processing. TM4000 optimization provides observation modes at three different voltages: 5kV, 10kV, and 15kV. Each mode has four adjustable current levels and is equipped with a four segment backscatter detector, which can capture image information from four different directions and image the sample in multiple modes. It has a brand new SEM-MAP navigation function, and at the same time, electron microscope images can be exported in the form of reports. Equipped with a large sample compartment, it can accommodate large samples with a diameter of 80mm and a thickness of 50mm.
Product Details
TM4000 desktop electron microscopeVarious observations can be made under low vacuum conditions,For powders or samples containing water that are prone to static electricity, observation can be conducted based on their purpose.
Secondary electron imaging (surface shape) observation can be performed under low vacuum conditions.
No pre-treatment is required, and the surface of insulation materials and samples containing water or oil can be observed
Not only can traditional conductive samples be observed, but also insulating materials and samples containing water or oil can be observed without pre-treatment. It can quickly switch between secondary electron images and backscattered electron images.
High sensitivity low vacuum secondary electron detector
Adopting a high-sensitivity low vacuum secondary electron detector (UVD). By detecting the light generated by the collision between electron beams and residual gas molecules, images with secondary electron information can be observed. In addition, by controlling the detector to detect the light generated by electron irradiation, CL information (UVD-CL: image with CL information) can be obtained.
Detection principle of high sensitivity and low vacuum secondary electronic detector
Can support acceleration voltage of 20 kV
TM4000 II/TM4000Plus II can support an acceleration voltage of 20 kV.
With EDS analysis (optional), higher count rate analysis can be performed.
By accelerating the voltage to 20 kV, high S/N of EDS element distribution map can be achieved
EM sample stage (optional)
Easy to observe STEM images
TM4000 desktop electron microscopeWhen used in conjunction with the newly developed STEM sample stage and high-sensitivity low vacuum secondary electron detector (UVD), small magnification STEM images can be easily observed.
Easy observation of thin film samples and biological samples.
Sample: Mouse Kidney
Acceleration voltage: 15 kV
Observation signal: STEM image
Magnification: 1000 times
Sample: Mouse liver
Acceleration voltage: 15 kV
Observation signal: STEM image
Magnification: 5000 times
