TEM Chamber IC Testing

FF-T01A is a TEM cell up to 8GHz, benchmarked against FCC-TEM-JMC, suitable for IC testing.

FF-T01A extends the operating frequency range of the device to areas beyond the capabilities of existing equipment, enabling conduction emission and immunity testing of IC integrated circuits starting from 8GHz. The integrated circuit is installed in a fixed testing window and can be tested within 8GHz according to IEC 61967-2, IEC 61967-8, SAE 1752-3, IEC 62132-8, and GB/T 42968.2-2024 standards after installation. IC testing is no longer limited to using the old YDT 1690.2-2007 standard to complete the radiation immunity testing project in EMC testing of integrated circuits.

Same series products support customized development.

parameter
Dimensions: 68 * 28 * 16mm

Applicable frequency: DC-8GHz

VSWR：＜1.2