TEM Chamber IC Testing

FF-T02A is a TEM cell with a frequency of up to 3GHz, benchmarked against FCC-TEM-JMC, suitable for IC testing.

FF-T01A extends the operating frequency range of the device to areas beyond the capabilities of existing equipment, enabling conduction emission and immunity testing of IC integrated circuits starting from 3GHz. The integrated circuit is installed in a fixed testing window, and after installation, it can be tested within 3GHz in accordance with IEC 61967-2, IEC 61967-8, SAE 1752-3, IEC 62132-8, and GB/T 42968.2-2024 standards. IC testing is no longer limited to using the old YDT 1690.2-2007 standard to complete the radiation immunity testing project in EMC testing of integrated circuits.

Same series products support customized development.

parameter
Dimensions: 274 * 127 * 61mm

Applicable frequency: DC-3GHz

VSWR：＜1.2