Simplified atomic force microscope

NegotiableUpdate on 01/31

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

A simplified atomic force microscope is a microscope used in conjunction with an inverted optical microscope for the study of life sciences and biological material samples. It is a needle scanning atomic force microscope. It includes an electronic controller, optical lever detection, optical microscope, software for viewing the position of the needle tip and sample, obtaining image results, and post-processing. The system has the ability to position the sample relative to an inverted microscope on the XY axis of an atomic force microscope. The sample stage is suitable for culture dishes, glass slides, and standard AFM sample stages

Product Details

Simplified atomic force microscopeWorking mode:

1. Standard working mode:

1.1 Vibration mode

1.2 Contact mode

1.3 Phase Imaging Mode

1.4 Lateral Force Microscopy (LFM)

1.5 Force curve test can measure Young's modulus

1.6 Nanomanipulation

1.7 Nanolithography

1.8 Force Mapping Mode

1.9 Friction Mode Test

2. Optional working modes:

2.1 Magnetic force microscope mode (MFM mode)

2.2 Electrostatic force microscope mode (EFM mode)

2.3 Conductive Microscope Mode (C-AFM Mode)

2.4 Liquid scan mode

AFMWorkshop is a specialized company dedicated to designing and manufacturing atomic force microscopes. The founder of the company is Dr. Paul West, who has 30 years of experience in atomic force microscopy and is the author of the textbook "Atomic Forces Microscopes".

Simplified atomic force microscopeTechnical Specifications

Scanning range: 100 μ m, 50 μ m, 15 μ m

Z-direction range: 17 μ m, 7 μ m

XY direction drive resolution: 0.01 nm

Z-direction drive resolution: 0.003 nm

Z-direction measurement noise level: 0.15 nm

Sample size: diameter 25mm