Silicone oil coating analyzer

Testing principle

Through software program control, the X-ray generation path generates suitable X-rays to excite Si or other elements in the test thin film material. After being excited by X-rays, it becomes an unstable state, and the electrons in the high-energy layer will transition to the hole well while releasing specific energy to be received by the detector. Since each element has its own specific energy characteristic line, it can be accurately identified by the detector and calculated by computer software to determine its content. ·Only a large-area bulk silicon drift detector is used, with a resolution of 125eV, capable of distinguishing AK aluminum and Si elements.

Technical features

The testing adopts the principle of X-ray fluorescence spectroscopy, and no consumables are required during the testing process

·Vertical irradiation of the light tube enhances the excitation of silicon element properties

Good testing lower limit, can accurately measure the silicon coating amount of 0.01 ghn '

·Using large-area silicon drift detectors, the test results are extremely accurate

Configure high-definition liquid display, making the testing process and results clear at a glance

The device integrates multiple U-interfaces, and data and communication transmission meet various requirements

The internal environment of the air path has been significantly optimized, and the atmospheric environment can also be directly tested

One click testing/simple and intelligent operation, shorter testing process usage time, and more accurate results

Quickly adopting new model algorithms greatly improves the measurement stability of light elements