EDX4500 X Fluorescence Spectrometer

The X-ray fluorescence spectrometer utilizes the XRF detection principle to achieve rapid, accurate, and non-destructive analysis of various elemental components.

The EDX4500X fluorescence spectrometer has unique advantages in solving the problems of furnace front analysis and elemental composition analysis in steel products for steel enterprises.

Comparison table of efficiency before and after using XRF technology in a steel plant as an example

The main feature of this instrument is the use of an intelligent vacuum system, which can effectively excite light elements such as Si, P, S, Al, Mg, etc. The XRF technology can accurately analyze high content elements such as Cr, Ni, Mo, etc. It plays a role in controlling the smelting process with short testing time, greatly improving detection efficiency and work efficiency.

In addition, it is also widely used in alloy analysis, total element analysis, and harmful element detection applications.

Application field

Steel testing, full element analysis of ferroalloys, and detection of harmful elements.

Product performance parameters

Measurement element range: Sodium (Na)~Uranium (U)

Element content analysis range: ppm~99.99% (different materials have different analysis ranges)

Simultaneous analysis of elements: dozens of elements can be measured at once

Analysis accuracy: 0.05% (for samples with a content higher than 96%, stability after 21 tests)

Measurement time: 60 seconds to 200 seconds

The energy resolution of the detector is 145 ± 5ev

Pipe pressure: 5KV~50KV

Pipe flow: 50uA~1000uA

Measurement object status: powder, solid, liquid

Input voltage: AC 110V/220V

Environmental temperature: 15 ℃~30 ℃

Environmental humidity: 35%~70%

Sample cavity volume: 320mm × 100mm

Dimensions: 660mm × 510mm × 350mm

Weight: 65Kg

Standard Configuration

Efficient ultra-thin window X-ray tube

SDD silicon drift detector

Digital multi-channel technology

Signal to Noise Ratio Enhancer SNE

Special testing accessories for the steel industry

Optical path enhancement system

High signal-to-noise ratio electronic circuit unit

Built in high-definition camera

Automatic switching collimator and filter

Automatic spectrum stabilization device

Triple security protection mode

Independent matrix effect correction model

Multivariate Nonlinear Regression Program

Reliable overall steel frame structure

90mm x 70mm status display LCD screen

vacuum pump

Performance Characteristics

Efficient ultra-thin window X-ray tube, with indicators reaching the international leading level

The latest digital multi-channel technology makes testing faster, with a counting rate of 100000 CPS and higher accuracy, resulting in better performance in alloy testing

SDD silicon drift detector, with good energy linearity, energy resolution, and spectral characteristics, and high peak to back ratio

Instrument specific product - Signal to Noise Ratio Enhancer (SNE), which improves signal processing capability by more than 25 times

Low energy X-ray excitation of the element under test, with good excitation effect on light elements such as Si and P

Intelligent vacuum pumping system, shielding the influence of air, greatly expanding the scope of testing

The automatic spectrum stabilization device ensures the consistency of instrument operation

Electronic circuit units with high signal-to-noise ratio

Automatically switch collimators and filters for different samples, eliminating the tedious manual operation

Spectral decomposition technology decomposes spectral peaks, ensuring that the test results of the measured elements have equal analytical accuracy

The multi parameter linear regression method significantly suppresses the absorption and enhancement effects between elements

Built in high-definition camera

The LCD screen display makes important parameters of the instrument (tube pressure, tube flow, vacuum degree) clear at a glance

Software Introduction

Automatic switching between Chinese and English languages, customers can add other languages as needed

Humanized interface design, beautiful and reasonable windows

Multiple workspace and work curve storage function for easy analysis of various samples

Gaussian, net area, total area, element fitting and other spectral intensity calculation methods can be freely selected

Extremely sensitive element automatic recognition system

Detecting instances and data

EDX 4500 measurement of Cr, Mn, Ni, Cu, Mo data for stainless steel national standard samples