The EDX2000A energy dispersive X-ray fluorescence spectrometer (fully automatic micro area film thickness tester) is used to quickly focus and accurately analyze various simple and complex shapes of samples, such as flat, concave convex, corner, and curved surfaces, to meet the non-contact micro area coating thickness testing needs of industries such as semiconductors, chips, and PCBs. Through automated 3D movement of X, Y, and Z axes, dual laser positioning and protection system.
Semiconductor printed circuit board coating thickness gauge X-ray fluorescence spectrometerThe EDX2000A energy dispersive X-ray fluorescence spectrometer (fully automatic micro area film thickness tester) can quickly focus and accurately analyze various simple and complex shapes of samples such as flat, concave convex, corner, and curved surfaces, meeting the non-contact micro area coating thickness testing needs of industries such as semiconductors, chips, and PCBs. Through automated 3D movement of X, Y, and Z axes, dual laser positioning and protection system.







application field
Electroplating industry, electronic communication, aerospace new energy, hardware and bathroom, electrical equipment
Automobile manufacturing, magnetic materials, precious metal electroplating, universities and research institutes, etc
Ultra high hardware configuration
Semiconductor printed circuit board coating thickness gauge X-ray fluorescence spectrometerUsing Fast SDD detector with a resolution of up to 129eV, it can accurately analyze the characteristic signals of each element, and can also easily test complex substrates and multi-layer complex coatings.
Paired with high-power X-ray tubes, it can effectively ensure the stability of signal output and excitation, reducing instrument failure rates.
High precision automated 3D linkage of X, Y, and Z axes enables more accurate and rapid positioning of testing points for small irregular shapes such as arcs, arches, threads, spheres, etc.
Design highlights
The top-down design can adapt to the testing of more irregular and small samples. Compared to traditional optical paths, the signal acquisition efficiency has been increased by more than 2 times. A variable zoom high-precision camera, paired with a distance correction system, meets the testing needs of small products, steps, deep grooves, and countersunk samples. Programmable automatic displacement platform, small and dense multi-point testing, greatly improving sample efficiency. Comes with a built-in data verification system.
software interface
Humanized software interface makes operation more convenient.
The Chinese annotations of the curve make your operation easier to learn.
Real time monitoring of instrument hardware functions makes your use more reassuring.