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Semiconductor Dynamics Testing System

NegotiableUpdate on 05/06
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Semiconductor Dynamics Testing System $r $n $r $n Physical and Chemical Company provides one-on-one solutions and technical support

Product Details

Semiconductor Dynamics Testing System

Targeting semiconductor materials/devices (Si/SiC/GaN/organic/perovskite)Carrier dynamics+transient optoelectronics+dynamic characteristics of power devicesIntegrated testing platform,Physical and chemical instruments provide one-on-one exclusive solutions and full cycle technical support.

1. Carrier dynamics (material level)

  • Transient Photovoltage/Photocurrent (TPV/TPC), Time Resolved Fluorescence (TRPL), Time of Flight (TOF) Mobility.

  • Deep Level Transient Spectroscopy (DLTS), Charge Extraction (CE), Linear Boosting Carriers (CELIV).

  • Analysis parameters: carrier lifetime, mobility, diffusion length, defect state density, interface recombination rate.

2. Dynamic characteristics of power devices (device level)

  • Double pulse test (DPT): turn-on/turn off time, rise/fall time, switch loss, reverse recovery characteristics.

  • Dynamic Rds (on), gate charge Qg, short-circuit withstand capability (SCSOA), and body diode degradation testing.

  • Adaptation: MOSFET/IGBT/SiC MOSFET/GaN HEMT, covering 600V-10kV, 10A-1kA.

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