Scanning Kelvin Probe System

VersaSCAN SKP

Scanning Kelvin ProbeScanning Kelvin Probe System

VersaSCAN SKP integrates positioning system and signal recovery lock-in amplifier technology, piezoelectric vibration module, potentiometer, and tungsten wire probe. SKP technology measures the relative work function difference between the probe and the sample surface position. This is a non-destructive technology that can operate in environmental atmospheres, humid environments, and without electrolytes. The relative work function has been confirmed to be related to the corrosion potential (Ecorr). The high spatial resolution provided by SKP can be applied to materials, semiconductors, metal corrosion, and even coatings on these materials.

• Lock in amplifier: Signal Recovery 7230

• Surface morphology measurement can be performed to measure and set the distance between the probe and the sample.

• Using the same probe, combined with the surface morphology measurement, perform a fixed distance scan of the sample surface.

working principle
VersaSCAN SKPScanning Kelvin Probe SystemA new approach has been provided for surface science measurements, and Kelvin probes are non-contact, non-destructive instruments that can be used to measure the work function difference between conductive, semiconductive, or coated materials and sample probes. This technique works with a vibrating capacitive probe, which can measure the work function difference between the sample surface and the reference tip of the scanning probe by adjusting an applied front-end voltage. The improvement of the theory that the work function is directly related to the surface condition has made SKP a valuable instrument, and its ability to measure in humid or even gaseous environments has made previously impossible research a reality.

Application:

• Spot corrosion detection and online monitoring of growth processes for materials such as stainless steel and aluminum;

• Research on Defects and Integrity of Organic and Metal Coatings;

• The mechanism and detection of corrosion at the interface of metal/organic coatings;

• The peeling and detachment mechanism of organic coatings;

• Potential distribution in the heat affected zone of passivated stainless steel welding;

• Distribution behavior of cathode and anode regions of carbon steel and stainless steel in wet dry cycles;

• Characteristics of oxygen reduction reaction and metal corrosion process under thin liquid layer;

• Simulate online monitoring of corrosion potential in different atmospheric environments;

• Local corrosion sensitivity of materials such as aluminum alloys in atmospheric environments;

• Filiform corrosion of aluminum alloys;

• Structure and stability of metal surfaces modified with silane L-B film;

• Potential distribution characteristics of zinc iron coupling metal interface region;

• Carbon particle pollution detection on zinc surface treated with phosphating;

• Detecting stress distribution and stress corrosion cracking on the surface of small metals;

• Detect the surface cleanliness, defects, damage, and uniformity of small areas of metal and semiconductor materials;

• Research and evaluate the performance of gas-phase corrosion inhibitors;

• Electrochemical sensors;

Main technical parameters of the micro area scanning probe platform system:
1. Scanning range (X, Y, Z): 100mm × 100mm × 100mm
2. Scanning driver resolution: 8nm
3. Displacement bias code: linear, zero lag
4. Displacement: Closed loop positioning
5. Linear displacement encoding resolution: 50nm
6. Repeatability: 250nm
7. The seismic resistant optical platform adopts a honeycomb shaped internal design and a hard steel surface
8. Computer communication method: USB interface; Instruments are connected to each other via Ethernet
9. Control and analysis software: Randomly provide high-performance laptops with pre installed software. A single software platform controls all multiple scanning probe technologies; Embedded 3D data rotation view function to improve the presentation power of graphics; The results can be output in the form of images or tables for import into other analysis or reporting software.

10. Large sample pool: VersaScan L pool (optional accessory)
11. SECM electrochemical micro cell: VersaScan mL cell (optional accessory)
12. Sample observation system: VersaCAM, including camera, lens, and display screen (optional accessories)
13. Micro area technology: SECM, SVET, SKP, LEIS, SDC, OSP (optional)

Software features:

• Control: computer-controlled probe movement, digital/continuous scanning, scanning range, speed, data acquisition accuracy, etc;

• Operation: Easy to use, linear decoding real-time displacement display;

• Measurement: Scan first and then collect data. Single axis scanning can reach up to 70000 data points;

• Result: ASCII data file; Standard configuration for displaying and outputting 2D and 3D color images

The combination of SVET and SKP systems
SRET and SVET mainly measure the local electrochemical reaction process of materials in liquid electrolyte environment; SKP can measure the micro area characteristics of materials under different humidity atmospheric environments, and even other gas environments, as well as their changes with the environment. Now the company has organically combined SVET technology for local electrochemical reaction processes in liquid electrolyte environments with SKP technology for atmospheric environments, greatly expanding your research field, effectively utilizing resources, and reducing your purchasing costs.

Working characteristics of SVET-SKP system:
1. Non contact measurement, does not interfere with the measurement system;
2. It is sensitive to changes in the state of the interface zone, such as changes in element distribution, stress distribution, chemical distribution and electrochemical distribution of the material surface and surface facial mask;
3. Measure the potential distribution of metals, insulating films, and semiconductors;
4. For the measurement of extremely weak AC signals in the order of 10E-12A~10E-15A, the measuring device must have high anti-interference ability;
5. In situ visualization of sample micro area electrochemistry and surface changes, etc;
6. One dimensional, two-dimensional, and three-dimensional visualization and analysis (3D software is standard);
7. Particularly suitable for micro area microscopy analysis of material surfaces and interfaces in liquid and atmospheric environments.