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22B-1, Block A, Hechuan Building, No. 235 Nanjing Road, Nanyingmen Street, Heping District, Tianjin
Tianjin Ruili Optoelectronics Technology Co., Ltd
22B-1, Block A, Hechuan Building, No. 235 Nanjing Road, Nanyingmen Street, Heping District, Tianjin
Product Name:Sarspec Spectrometer X-RES
Product Model:X-RES 1
Product Introduction
X-RES is an ideal choice for spectrometers that require high-resolution performance, as it can analyzeaccurateDuda Compact arrangement spectral characteristics at 0.05 nm (FWHM). X-RES is installed on a sturdy and compact optical platform with a focal length of 100 mm, capable of providing within the working wavelength rangetallThe performance, sensitivity, and significant peak symmetry of this series of spectrometers make it a solution for high-resolution applications.
Users can integrate this spectrometer into their settings with features such as replaceable slits and optical filters, power status indicators, and trigger functions.X-RES offers ready to use (for more common applications) and user-defined (for more specific applications) configurations, suitable for narrow UV Vis and Vis-NIR ranges as well as extended UV Vis-NIR ranges.
Performance characteristics
lVery suitable for high-resolution applications
lUsers can replace the slit and optical filter
lOptical resolution as low as 0.05 nm (FWHM)
lImproved optical design -The focal length is 100 mm
lattach LightScan software
Selection Guide
Technical Specifications
Origin: Portugal
Scope of operation:185-1100 nm (divided into 8 operating ranges)
Spotlight lens: optional (included in the sensitivity enhanced version)
Fiber optic connector:SMA 905
Trigger: Input/Output
Slot size:10 μ m (replaceable)
Detector:3648 component Toshiba
Integration time:3ms-214s
Software:LightScan (included)
Grating: Based on the selected range
Optical resolution:0.05 to 0.1 nm
interfaceMini-USB
Product Application
X-RES is a spectrometer with high-resolution performance that can meet all the requirements of your high-resolution applications.
The user replaceable slit and optical filter functions allow you to set X-RES is used for more sensitive measurements. This flexibility combined with improved sensitivity makes the system a solution for high-resolution applications such as wavelength characteristics of lasers and LEDs, monitoring and calibrating spectral emission lines of sources, or determining atomic emission lines of elements.