Research grade upright material microscope Axioscope

NegotiableUpdate on 01/02

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Nature of the Manufacturer: Producers

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Overview

The research grade upright material microscope Axioscope can measure grain size, phase content, inclusions, and film thickness; Capable of conducting metallography and polarization imaging, providing complete solutions for materials science. By using the C-DIC (Circular Polarization Differential Interference Contrast) observation method, small convex structures such as scratches on the sample surface (100um) can be highlighted.

Product Details

Research grade upright material microscope model: Axioscope

研究级正置材料显微镜 Axioscope

Research grade upright material microscope AxioscopeThe series is suitable for data quality andTesting work that requires high repeatability.

Product featuresCan measure grain size, phase content, inclusions, and film thickness, etc; Capable of conducting metallography and polarization imaging, providing complete solutions for materials science.

Research grade upright material microscopeAxioscopeCore parameters:

Optical system:Infinite distance chromatic aberration correction and contrast enhancement optical system.

objective lense:5x、10x、20x、50x、100x， Optional sizes include 1.25x, 2.5x, 40x, and 150x.

Eyepiece:10x/23。

Observation function:Reflected light includes bright field, ADF advanced dark field, circularly polarized light, differential interference, and fluorescence.

Objective lens turntable:6 holes.

Application cases:By using the C-DIC (Circular Polarization Differential Interference Contrast) observation method, small convex structures such as scratches on the sample surface (100um) can be highlighted.

研究级正置材料显微镜 Axioscope