Rapid scanning probe microscope

HR-AFMRapid scanning probe microscopeIt is a professional grade high-resolution atomic force microscope with Z-axis noise below 35 picometers. This device can observe the three-dimensional morphology and multiphase structure of sample micro areas without damaging the internal structure of the sample; At the same time, the physical and chemical properties of the sample surface can be studied, numerically measured, and analyzed.

Domestic produced HR-AFM atomic force microscope

Standard operating modes: Vibration mode, Contact mode, Phase imaging mode, Lateral force mode (LFM), Force Curve testing, Nanomanipulation, Nanolithography, Force Mapping, Friction mode

Optional working modes: Conductive Atomic Force Microscopy (C-AFM), Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Scanning Potential Microscopy (SKPM).

Rapid scanning probe microscopeIt has software automatic needle insertion function. Automatic probe insertion through software control of Z-direction motor

X. A scanner with Y-axis and Z-axis separation.

Scanning range 100 × 100 × 17 μ m

Z-axis resolution 0.035nm

Sample table size: 25mm * 25mm * 18mm

Operating software: Control using Laview environment language, provide free operating software, and provide maintenance and upgrades

Provide Gwydition IMAGE Analysis Software data analysis system

Optical resolution of top view system ≤ 2 microns

The field of view range is adjustable from 2mm * 2mm to 300um * 300um, and the magnification is mechanically adjustable from 45x to 400x

Side view system, providing visual needle insertion, can accurately observe and control the needle insertion process through computer, preventing needle collision