Printed substrate high and low temperature test chamber IC semiconductor constant temperature and humidity chamber

Printed substrate high and low temperature test chamber IC semiconductor constant temperature and humidity chamberIt is to test the heat resistance, cold resistance, and dry resistance of various materials. Suitable for quality testing of electronic, electrical, communication, instrument, vehicle, plastic products, metal, food, chemical, building materials, medical, aerospace and other products.
How many temperatures are generally used for conducting high and low temperature tests on power supplies, resistors, capacitors, and photovoltaic products? Generally, high and low temperature chambers with a temperature range of -40-+150 ℃ are more suitable and meet domestic and dual testing requirements.

1Printed substrate high and low temperature test chamber IC semiconductor constant temperature and humidity chamberProduct Specifications
Model: TD-100R Studio Size D × W × H: 450 × 450 × 500
Model:TD-225R studio size D × W × H: 500 × 600 × 750

Model:TD-500R studio size D × W × H: 800 × 700 × 900
Model:TD-1000R studio size D × W × H: 1000 × 1000 × 1000
Model:TD-1300R studio size D × W × H: 1000 × 1000 × 1300

IIPrinted substrate high and low temperature test chamber IC semiconductor constant temperature and humidity chamberTechnical specifications
1. Temperature range: -20 ℃~150 ℃, -40 ℃~150 ℃, -60 ℃~150 ℃, -70 ℃~150 ℃
2. Temperature uniformity: ≤± 2 ℃ (when unloaded)
3. Temperature fluctuation: ± 0.5 ℃ (when unloaded)
4. Temperature deviation: ≤± 2 ℃
5. Cooling rate: 0.7-1.2 ℃/min
6. Heating rate: 1.0-3.0 ℃/min
7. Time setting range: 0-999 hours
8. Temperature fluctuation range: -40~150 ℃
9. Noise: ＜ 65dB

IIIPrinted substrate high and low temperature test chamber IC semiconductor constant temperature and humidity chamberStructure Introduction:
1. The outer shell is made of high-quality Su304 stainless steel plate and processed into shape by CNC machine tools. The surface of the shell is treated with wire drawing, making it more smooth and beautiful.
2. The inner liner adopts imported high-grade stainless steel (SUS304) mirror panel.
3. Insulation material: high-density glass fiber cotton The insulation thickness is 100mm
4. Temperature cycle system: using a specially designed low-noise long axis fan motor with stainless steel multi blade impellers that are resistant to high and low temperatures, to achieve strong convection and vertical diffusion circulation.
5. Double layer high tensile sealing strips with high temperature resistance are used between the door and the box to ensure the sealing of the testing area
6. Using non reactive door handles makes operation easier
7. The bottom of the machine adopts high-quality fixed PU movable wheels
8. The observation window is made of multi-layer insulated tempered glass, and the inner side is coated with laminated conductive film for heating and defrosting (clearly observe the test process)
9. The test hole (on the left side of the machine) can be used for external testing power or signal lines (the aperture or number of holes needs to be increased and indicated)

4Printed substrate high and low temperature test chamber IC semiconductor constant temperature and humidity chamberRefrigeration system control

1. Compressor: Fully enclosed French Taikang 1.5HP × 2 × 1 set
2. Refrigeration method: cascade refrigeration
3. Condensation method: forced air cooling
4. Refrigerant: R404A, R23 (environmentally friendly)
5. All system pipelines undergo a 48 hour leak detection test with ventilation and pressurization
6. Heating and cooling system * independent
7. Internal spiral refrigerant copper tube
8. Slope evaporator
9. The dry filter, refrigerant flow window, repair valve, oil separator, solenoid valve, and storage tank are all imported original parts
10. Dehumidification system: using evaporator coil dew point temperature laminar contact dehumidification method
11. Start R404A and R23 during cooling, and only start R404A during dehumidification (energy-saving and consumption reducing)

5Printed substrate high and low temperature test chamber IC semiconductor constant temperature and humidity chamberheating system
1. Using far-infrared nickel alloy high-speed heating (2KW × 2) electric heater
2. High temperature independent system, does not affect low temperature testing, high temperature testing, and alternating wet heat testing
3. The output power of temperature and humidity control is calculated by a microcomputer to achieve high-precision and high-efficiency electricity efficiency

VIPrinted substrate high and low temperature test chamber IC semiconductor constant temperature and humidity chamberCircuit control system

1. The temperature control instrument adopts the "Korean original TEMI850" large screen - LCD display - programmable microcomputer PID control SSR output operation. Fully imported large LCD touch screen display, simple screen operation, and easy program editing.
2. Accuracy: 0.1 ℃ (display range)
3. Resolution: ± 0.1 ℃;
4. Temperature sensor: PT100 platinum resistance thermometer;
5. Control mode: thermal balance temperature and humidity control mode; All electrical appliances use Schneider series products
6. Temperature and humidity control is achieved through coordinated control of the same channel using the P.I.D+S.S.R system
7. Equipped with automatic calculation function, it can immediately correct the temperature and humidity change conditions, making temperature and humidity control more accurate and stable
8. The controller operation interface is available in both Chinese and English, and the real-time operation curve chart can be displayed on the screen
9. It has a capacity of 100 programs, 100 segments per group, and 999 steps per segment, with a maximum time setting of 99 hours and 59 minutes per segment
10. After inputting the data and experimental conditions, the controller has a screen lock function to avoid manual touch and shutdown
11. Equipped with RS-232 or RS-485 remote communication interface, it can be programmed on a computer to monitor the testing process and perform functions such as automatic power on/off
12. The controller has an automatic screen saver function, which better protects the LCD screen during long-term operation (making its lifespan longer)
13. The return air outlet of this test chamber is equipped with an automatic defrosting device (so that the water vapor generated during the test will not accumulate on the refrigeration evaporator and cause ice blockage)
7Temperature and humidity calibration test chamber, -40 degree low temperature test chamberprotection system

1. Fan overheat protection
2. Overall equipment under phase/reverse phase protection
3. Overload protection for refrigeration system
4. Refrigeration system overpressure protection
5. Overall equipment timing
6. Overheating of water pump, overcurrent protection
7. Other protections include leakage, water shortage, operation indication, automatic shutdown after fault alarm, etc.
8、 Random data
1. Instruction manual, circuit diagram
2. Operation method, precautions, basic shipping accessories, maintenance and repair matters
9Temperature and humidity calibration test chamber, -40 degree low temperature test chamberEquipment usage conditions
1. Environmental temperature: 5 ℃~+28 ℃ (average temperature within 24 hours ≤ 28 ℃)
2. Environmental humidity: ≤ 85%
3. Power requirement: AC380 (± 10%) V/50HZ three-phase four wire system
10Temperature and humidity calibration test chamber, -40 degree low temperature test chamberBox execution standard
GB10592-93 Technical Conditions for High and Low Temperature Test Chamber
GB2423.1-2001 Test A Low temperature Test Method
GB2423.2-2001 Test B High temperature test method
GB2423.4-93 Test Db Alternating High and Low Temperature Test Method
PS: The operating environment needs to be below room temperature of 28 degrees Celsius and well ventilated. The machine should be placed 80 centimeters in front, back, left, and right, and no objects should be placed