OSI Prince Phase Difference Elliptical Polarization Measurement Device in Stock

OSI Prince Phase Difference Elliptical Polarization Measurement Device in Stock

OSI Prince Phase Difference Elliptical Polarization Measurement Device in Stock

KOBRA-HB (Basic Standard) KOBRA-HBPR (Elliptical Polarization) KOBRA-HBSPC (Spectral Full Spectrum)

KOBRA-HB Series Phase Difference/Elliptical Polarization Measurement Device

■ Characteristics

1. Measurement method:
   Parallel Nicol rotation method
   Rotating polarizer method
   Parallel Nicol spectroscopy method
   
   

2. Measurement wavelength:
   450、500、550、590、630、680nm
   ， 400-800nm (spectral range)
   
   

3. Sample size for vertical incidence measurement
   30mm square or larger.
   Incident angle dependence: 30mm to 40x50mm, t3 or smaller.
   
   

4. Measurement area
   33mm ² (5.8mm square: photoreceptor cell area)
   0.8mm (spectrum)

Oji Keisoku (OSI Prince Measurement) KOBRA-HB Series Phase Difference/Elliptical Polarization Measurement Device Product Introduction

1、 Core Measurement Principle (Three in One Technology)

1. Parallel Nicol rotation method (standard mode)High speed measurement within the planePhase difference (Re), azimuth angle (φ), birefringence (Δ n)Suitable for large-scale mapping and rapid sampling

2. Rotating Polarizer Method (Elliptical Polarization Mode, HBPR): Obtained by one rotationEllipticity ψ, phase difference ΔCalculate film thickness, refractive index, extinction coefficient, and adapt to semiconductor/optical coatings

3. Parallel Nicol spectroscopy (spectral mode, HBSPC)Continuous spectrum of 400~800nm, measuredWavelength dispersion characteristics (Re - λ)Analyze the dispersion behavior of multilayer films, liquid crystals, and optical films

2、 Core models and configurations (three main models)

3、 Core technical parameters (high-precision indicators)

• Phase difference range：Below 2nm to 20000nm(Full range without blind spots, covering ultra-thin to ultra thick samples)

• Phase difference resolution：0.001nmRepeatability (3 σ):≤0.03nm(150nm standard plate, 590nm)

• Azimuth resolution：0.001°Repeatability (3 σ):≤0.005°(High precision orientation angle)

• light sourceLong life LED (lifespan>20000 hours), maintenance free, no need to replace lamp, stability far exceeds traditional halogen/mercury lamps

• sample sizeMaximum 100 × 100mm, thickness ≤ 3mm; large opening design, can be directly inserted into polarizing plates and large films

• Device dimensionsW300 × D700 × H500mm (40% reduction in volume compared to KOBRA-W, saving space)

• Measuring speedSingle point measurement<1 second; High speed scanning in mapping mode

4、 Core advantages (compared to KOBRA-W series)

1. Breakthrough in ultra wide rangeFrom ultra-low Re (below 2nm) to ultra-high Re (20000nm), one device covers all birefringent samples without the need for multiple devices to switch

2. Accuracy and stabilityImproved azimuth/phase difference resolution, minimal long-term drift, suitable for 24-hour continuous quality control on production lines

3. Maintenance free LED light sourceLifespan>20000 hours, no consumables, no preheating, tested immediately upon startup, significantly reducing operation and maintenance costs

4. Compact large openingSmaller volume, larger sample opening, compatible with large/thick sheets, suitable for both laboratory and production lines

5. Three in one multifunctionalStandard/Elliptical Polarization/Spectral Three Modes, Meeting All Needs from Basic Detection to Research and Development

6. Software and AutomationSpecialized analysis software that automatically calculates Re/φ/Δ n/ψ/Δ, generates mapping graphs, dispersion curves, and exports data; Support automatic sampler selection

5、 Applicable samples and typical applications

Applicable samples

• Optical films: PET/PI/COP/LCP/PC, phase difference film, polarizing plate, compensation film, stretch film

• Display/LCD: LCD cell, TFT, OLED optical layer, polarizing component

• Semiconductor/Coating: Dielectric thin film, optical coating, photoresist, multilayer film

• Polymer/glass: plastic sheets, glass internal stress, fibers, composite materials, transparent sheets

Typical Applications

1. Optical film research and development: optimization of stretching process, evaluation of orientation uniformity, birefringence/phase difference control, thermal shrinkage analysis

2. Display panel quality control: detection of polarizer/LCD cell phase difference, rotation angle, and oblique incidence characteristics

3. Semiconductor/Coating: Analysis of Film Thickness, Refractive Index, Extinction Coefficient, and Multilayer Film Structure

4. Material failure analysis: investigation of internal stress, birefringence anomalies, and orientation defects

6、 System composition and selection

• Standard configuration: Host (LED light source+polarizing optical system+rotating table), dedicated analysis software, standard calibration plate, sample fixture

• Core optional:

• Automatic sampler (continuous measurement of batch samples, 20-50 pieces)

• Tilted rotary table (0-60 ° oblique incidence, measuring angle dependence)

• Micro spot module (0.8mm in diameter, measured locally)

• High temperature sample stage (room temperature~150 ℃, birefringence measurement at high temperature)

• Data export/PLC docking/production line monitoring module

7、 Ecological linkage with Prince Measurement

8、 Procurement channels

Welcome industry customers and partners to inquire and negotiate cooperation:

Yuqi Scientific Instruments (Shenzhen) Co., Ltd

Special Manager: ¹⁵⁸¹⁵⁵⁵⁰⁹⁹⁸ (Lin)

Address: Yuqi Science, 7th Floor, E-commerce Group, No. 906 Longhua Street, Longhua New District, Shenzhen, Guangdong Province

#Oji Keisoku OSI Prince Measurement China Agent Tamazaki Scientific Instruments (Shenzhen) Co., Ltd