Nano scanning probe microscope

NegotiableUpdate on 01/31

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Nanoscan scanning probe microscopy can observe the three-dimensional morphology and multiphase structure (nanoscale) of sample micro regions without damaging the internal structure of the sample; At the same time, the physical and chemical properties of the sample surface can be studied, numerically measured, and analyzed.

Product Details

Nano scanning probe microscopeWorking mode:

1. Standard working mode:

1.1 Vibration mode

1.2 Contact mode

1.3 Phase Imaging Mode

1.4 Lateral Force Microscopy (LFM)

1.5 Force curve test can measure Young's modulus

1.6 Nanomanipulation

1.7 Nanolithography

1.8 Force Mapping Mode

1.9 Friction Mode Test

2. Optional working modes:

2.1 Magnetic force microscope mode (MFM mode)

2.2 Electrostatic force microscope mode (EFM mode)

2.3 Conductive Microscope Mode (C-AFM Mode)

2.4 Liquid scan mode

AFMWorkshop is a specialized company dedicated to designing and manufacturing atomic force microscopes. The founder of the company is Dr. Paul West, who has 30 years of experience in atomic force microscopy and is the author of the textbook "Atomic Forces Microscopes".

Nano scanning probe microscopeTechnical Specifications

Scanning range: 100 μ m, 50 μ m, 15 μ m

Z-direction range: 17 μ m, 7 μ m

XY direction drive resolution: 0.01 nm

Z-direction drive resolution: 0.003 nm

Z-direction measurement noise level: 0.15 nm

Sample size: diameter 25mm