Naichi laser flash thermal conductivity analyzer

The temperature range of the Naichi laser flash method thermal conductivity analyzer is from -100 ° C; C to 500 C， No need to replace the detector or furnace body, LFA467 HyperFlash can achieve -100 on the same instrument; C to 500 The wide temperature range of C.

　　Naichi laser flash thermal conductivity analyzerThe temperature range of LFA467 HyperFlash is from -100 ° C to 500 ° C, without the need to replace detectors or furnace bodies. It can achieve a wide temperature range of -100 ° C to 500 ° C on the same instrument. The sampler is equipped with 16 sample grades, and the sample capacity is 4 times that of the original. ZoomOptics optimizes the detection range of the detector, thereby eliminating the influence of aperture stop. Significantly increased the accuracy of measurement results. High sampling frequency (2MHz), especially suitable for thin film samples

LFA 467 HyperFlash® -Naichi laser flash thermal conductivity analyzerTechnical Specifications:

Temperature range: -100 ° C... 500 ° C, single furnace body

Xenon lamp, maximum energy 10 J/Pulse (power adjustable)

Non contact measurement, IR detector detects the temperature rise process on the surface of the sample

Data acquisition rate: up to 2MHz (including half temperature signal detection and pulse mapping technology) - for high thermal conductivity and thin film samples, the sampling time (about 10 times the half temperature time) can be as low as 1ms, and the sample thickness can be as thin as 0.01 mm or less (depending on the specific thermal conductivity)

Measurement range of thermal diffusivity coefficient: 0.01 mm2/s... 1000 mm2/s

Measurement range of thermal conductivity:<0.1 W/(mK)... 2000 W/(mK)

Sample size:

-Diameter 6 mm... 25.4 mm (including square samples)

-Thickness 0.01 mm... 6 mm (the thickness requirement of the sample depends on the thermal conductivity of different samples)

An automatic sampler with 16 sample grades and over 20 types of supports, offering a wide range of measurement modes to accommodate various types of samples. Such as anisotropic materials, multi-layer mode analysis, thin films, fibers, liquids, pastes, powders, molten metals, testing under pressure, and so on.