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18698644445
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A201, Building 1, No. 286 Qinglonggang Road, High Speed Rail New City, Xiangcheng District, Suzhou City
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Guochuang Scientific Instruments (Suzhou) Co., Ltd
Multi functional X-ray absorption spectrometer
NegotiableUpdate on 02/09
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Overview
The SuperXAFS M9000, a multifunctional X-ray absorption spectrometer developed by Guochuang Technology, supports near edge fast scanning and transmission/fluorescence mode absorption and emission spectra.
Product Details
Guochuang Technology InstrumentMulti functional X-ray absorption spectrometerSuperXAFS M9000
Core parameters
1. Energy range: 4.5-20keV, upgradable to 25keV
2. Luminous flux at the sample site: ≥ 4 × 106photons/s @7-9 keV
3. Energy resolution: 0.5-1.5 eV@7-9 keV
4. Energy repeatability: ≤ 30 meV@24h
5. Adjustment mechanism accuracy: The minimum step size for energy scanning is 0.1eV
working mode
1. Supports near edge quick scan function.
2. Support transmission/fluorescence mode absorption and emission spectra.
Key Features
1. Customize automatic collection of multiple samples to reduce the number of injections.
2. Provide a standard sample database to simplify user analysis.
3. Support in situ scene customization and provide professional data analysis guidance for absorption spectra.
Guochuang Technology InstrumentMulti functional X-ray absorption spectrometerSuperXAFS M9000
X-ray Absorption Fine Structure Spectrometer (XAFS/XES) is a non-destructive technique used to study the local structure and electronic state of materials. This technology utilizes the interaction between X-rays and matter to obtain the near edge absorption spectrum (XANES), extended far edge absorption spectrum (EXAFS), and specific band emission spectrum of a specified element, which are used to analyze the chemical and valence states of the element, the coordination structure of the local environment around the atom, and to distinguish the coordination atom category of the measured element. It is an important means of characterizing the micro coordination structure of crystalline and amorphous materials. XAFS/XES is mainly used for the analysis of valence states, coordination structures, and electronic states of metal ions in catalysts, alloys, ceramics, environmental pollutants, various crystalline and amorphous materials, and biological samples, as well as the study of the dynamic evolution process of local structures of materials under changes in thermal, optical, electric, and magnetic fields.
