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Guangdong Tianrui Instrument Co., Ltd

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    No. 1888, Zhonghua Yuan West Road, Yushan Town, Kunshan City, Jiangsu Province

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Metallized film capacitor composition analyzer Tianrui Instrument

NegotiableUpdate on 05/07
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Overview

The use of X-ray fluorescence spectrometer (XRF) to measure the aluminum (Al) and zinc (Zn) content in metalized capacitor coatings is a fast, non-destructive, efficient, and widely applicable technique. Metallized film capacitor composition analyzer Tianrui Instrument

Product Details

UseXX-ray fluorescence spectrometer(XRF)Measurement of Aluminum in the Coating of Metallized Film Capacitors(Al)And zinc(Zn)Content is a type ofFast, non-destructive, efficient, and widely applicable technologyThe following is a detailed explanation of its application, principles, advantages, and precautions:

XX-ray fluorescence spectrometer(XRF)⭐Core principle

1. Inspire:XRFceremonySend out high-energy primaryXThe radiation beam is irradiated onto the surface of the sample (metalized film of the capacitor).

2. Ionization:basicXRadiation causes the inner layer electrons of elements in the surface layer (usually a few micrometers deep) of the sample, such asKLayer orLThe layer is excited and ejected, forming a hole.

3. Relaxation emission:When an atom in an unstable state transitions from an outer orbital electron to fill a hole, it releases a secondary energy of a specific energyXRay (characteristic)XX-ray fluorescence).

4. Detection and analysis:The detector receives these emitted characteristic fluorescence signalsXRay. Different elements haveSpecific featuresXRadiation energy (or wavelength):

oaluminiumKαThe line is approximately1.486 keV(orLαLine about1.487 keV).

oZinc:KαThe line is approximately8.638 keV.

5. Quantitative:By measuringAlandZnThe intensity of characteristic peak lines (peak area or height in the spectrum), combined with calibration curves (established using standard samples with known content), can be used to calculate the aluminum and zinc content in the coatingMass percentage (weight)%)Or the content distribution in the direction of coating thickness (through depth analysis mode).

Metallized film capacitor composition analyzer Tianrui Instrument Product Description, Technical Parameters, and Configuration

The EDX 4500H X fluorescence spectrometer utilizes the XRF detection principle to achieve rapid, accurate, and non-destructive analysis of various elemental components.
The main feature of this instrument is the use of an intelligent vacuum system, which can effectively excite light elements such as Si, P, S, Al, Mg, etc. The XRF technology can accurately analyze high content elements of interest such as Cr, Ni, Mo, etc. It plays a role in controlling the smelting process with short testing time, greatly improving detection efficiency and work efficiency.
In addition, it is also widely used in alloy analysis, total element analysis, and harmful element detection applications.

Metallized film capacitor composition analyzer Tianrui Instrument Performance characteristics

Ultra thin window X-ray tube
Digital multi-channel technology makes testing faster, with a counting rate of 100000 CPS and higher accuracy, resulting in better performance in alloy testing
FAST-SDD detector, with good energy linearity, energy resolution, and spectral characteristics, and high peak to back ratio
Low energy X-ray excitation of the element under test, with good excitation effect on light elements such as Si and P
Intelligent vacuum pumping system, shielding the influence of air, greatly expanding the scope of testing
The automatic spectrum stabilization device ensures the consistency of instrument operation
Electronic circuit units with high signal-to-noise ratio
Automatically switch collimators and filters for different samples, eliminating the tedious manual operation
Spectral decomposition technology decomposes spectral peaks, ensuring that the test results of the measured elements have equal analytical power
The multi parameter linear regression method significantly suppresses the absorption and amplification effects between elements
Built in high-definition camera
The LCD screen display makes important parameters of the instrument (tube pressure, tube flow, vacuum degree) clear at a glance

Coal ash composition element rapid analyzer Tianrui InstrumentStandard Configuration

Ultra thin window X-ray tube
FAST-SDD detector
Digital multi-channel technology
Optical path enhancement system
High signal-to-noise ratio electronic circuit unit
Built in high-definition camera
Automatic switching collimator and filter
Automatic spectrum stabilization device
Triple security protection mode
Reliable overall steel frame structure
90mm × 70mm status display LCD screen
vacuum pump