Maintenance of ion pollution tester

The Omegameter 600SMD ion pollution tester, also known as ion pollution tester, pollution tester, circuit board pollution tester, or incorrectly written as particle pollution tester, was originally the American OMEGA Megameter 600SMD ion pollution tester and has now been acquired by American Instruments * SCS as a product under its umbrella.

The ion pollution tester is a precision testing instrument that serves the printed circuit board industry and related industries. It can perform ion pollution testing on light plates before and after cleaning, coating, and other processes; Expand its application to testing products at a certain stage of the component production process or conducting ion contamination testing on circuit boards before and after assembly and cleaning; Beneficial for further improving the lifespan, reliability, and environmental pollution control of electronic products.

品牌： Specialty Coating System

Model: Omegameter 600SMD

Measurement range: 0~100 μ g/cm2

Measurement objects: bare board, assembled board, semiconductor packaging products

Weight: 230 kilograms

Scope of application: 66.04 centimeters

As a widely accepted product by customers, 600SMD has become a representative device for ion pollution testing in the electronics industry, used for process monitoring and factory inspection in semiconductor production, packaging, electronic assembly, and printed circuit board manufacturing. Starting from the second half of 2010, OM600SMD will undergo a complete redesign. The new model maintains the convenience of the previous model, while improving automation, testing accuracy, and safety. It also adds optional software functions, allowing users to view and record testing process curves and generate test reports on a computer. The number of storable part numbers has also increased from 30 to 99.Maintenance of ion pollution tester

Operating principle:

The SMD600 ion pollution tester monitors the resistance of ions in the mixed solution to determine the amount of ions contained.

At the beginning of the test, the system's detector and recorder will establish a benchmark data based on the initial ion content in the test slot, and then calculate the amount of ions added during the test. When all ions dissolve into the test solution, an equilibrium value can be reached. When testing through-hole boards, these operations take approximately 5-10 minutes, and when testing SMD boards, they take approximately 30-45 minutes.

After testing the binding element, the ion content level after * will be compiled into a microscopic graph, including NaCl/qq. inch, the tested parameters, and whether it is qualified according to the set standards. Before the next test, the test solution will be cleaned by the ion removal system in the instrument to achieve regeneration function and establish a new benchmark level.

Features: Compact, independent, microprocessor controlled, precise and repeatable system

Simple and user-friendly interface, the database can store 30 test sample data

Automatic test termination, printed output of pollution curve and test parameters

Heating test solution to improve the solubility of pollutants

Submerged injection inside the test chamber increases solution penetration

High speed testing of dissolution circulation pump

Interchangeable test chambers ranging from 8'x8 'to 26'x26'

Maintenance of ion pollution tester