In situ analyzer for large-sized metal components

Working principle: Original Statistical Distribution Position Analysis (OPA) is a technique for analyzing the chemical composition and structure of the original state of the analyzed object. By using a highly stable continuous excitation spark light source to excite large-area metal materials, direct amplification and high-speed data acquisition of single discharge spectral signals generated by no pre ignition and continuous scanning excitation are carried out, and chemical composition and surface structural information are obtained to achieve quantitative analysis of sample composition and state.

OPA-500In situ analyzer for large-sized metal componentsTechnical parameters and advantages

Grating:

Focal length: 500mm

Engraving density: 2700 lines/mm

Line resolution: 0.7407nm/mm

Resolution: ≤ 0.01nm

Wavelength range: 160-650nm

Collection system:

Control mode: COM

Frequency: 100KHz

Number of channels: configurable Transmission method: Ethernet

Scan:

CNC control system: Siemens system

3-axis travel: Y-axis 247mm; Z-axis 350mm; X-axis 360mm;

Scanning end face to workbench distance: 0-120mm

Speed: 60-180mm/min

Position accuracy: Bidirectional positioning accuracy X-axis 0.016/0.010mm; Y/Z axis 0.012/0.01mm

Bi directional repetitive positioning accuracy X axis 0.008/0.006mm; Y/Z axis 0.008/0.006mm

Scanning range: 300 * 200 mm

Workpiece weight: Load capacity (evenly distributed) 200kg

Compressed air working pressure: 0.6Mpa

Scanning format: Square, Circular, Metric, Fan, Alien

Power requirement: 220 (1 ± 10%) VAC, 50Hz

Whole machine volume: W: 1929mm; D:1428mm； H:2016mm

OPA-500In situ analyzer for large-sized metal componentsInstrument Features

Quantitative distribution characterization of the position of each element component in the cross-section of large-sized components:

1. Obtain the accurate content of each element at any lattice coordinate position (X, Y)

2. Quantitative distribution and characterization of element content changes in any line segment

3. Quantitative distribution trends and orientation characterization of various elements in different parts of the entire region

Characterization of segregation degree of various elements in the entire (or local) area of large-sized components:

lBased on massive lattice data of various elements, a characterization model of content frequency statistical distribution is established to achieve cross scale statistical characterization and analysis of various parameters such as segregation degree, conformity degree, and porosity of elements in the entire (or local) domain of large-sized components

lCharacterization of global (or local) inclusion distribution in large-sized components:

lBased on the theory of diffusion discharge along the boundary of inclusions (precipitated phases) during a single discharge, a relevant characterization model for the distribution of inclusion states is established to achieve the full domain (or local domain) of large-sized components:

1. Classification and quantitative characterization of inclusions

2. Characterization of particle size distribution of inclusions

3. Characterization of location distribution of inclusions

High precision sample mobile scanning analysis platform:

The proprietary technology of precise scanning and positioning of analytical samples, as well as spectral quantitative analysis, has been systematized to achieve accurate scanning and measurement of samples

Adapt to specimens of different shapes:

By adopting adaptive simulation matching scanning technology, it is possible to adapt to the different shapes of samples and analyze the in-situ statistical distribution of samples with sizes smaller than 300*200mm.

Data and Visualization:

1. High speed data acquisition and processing technology to achieve real-time data synchronization with scanning

2. Based on massive data and specialized models, visualize the statistical distribution of a series of parameters (element content/inclusions, etc.) globally or locally (frequency distribution map, one-dimensional distribution map of specific line segments, two-dimensional view of profiles, three-dimensional view of profiles, etc.)

Important applications of the instrument:

1. Segregation degree table of composition for large-sized metal components

2. Characterization of anisotropic orientation of metal material components

3. High throughput in situ statistical mapping characterization of material genomics engineering

Non contact measurement, rapid response, short analysis time, can meet the requirements of real-time analysis and online analysis.