Energy dispersive X-ray fluorescence spectrometer XD-1000 fully automatic film thickness gauge

Energy dispersive X-ray fluorescence spectrometer XD-1000 fully automatic film thickness gaugeThe top illuminated spectral thickness gauge is a specialized tool for detecting various irregular parts, analyzing the thickness of various coatings, and analyzing the plating solution. It is suitable for testing various oversized parts, irregular groove parts, small and dense multi-point testing, or automatically detecting a large number of small parts one by one

Especially for composition and thickness analysis spectrometers for surface treatment of hardware molds, bathroom products, circuit boards, and high-precision electronic components.

Widely used for quality control of various products, incoming material inspection, and measurement of production process control.

1) Equipped with a micro focused X-ray generator and an excellent optical path conversion focusing system, it has non-destructive zoom detection technology, with a minimum measurement area of 0.01mm ²

2) Manual zoom function, capable of non-destructive testing of various irregular groove parts, with groove depth range of 0-70mm

3) The core EFP algorithm can perform fast, accurate, and stable data analysis on multiple layers and elements. Equipped with a fully automatic programmable mobile platform, it can achieve unmanned, multi-point, and multi sample precise displacement and simultaneous detection

4) 23 coatings and 24 elements can be analyzed simultaneously, with a measurement range of chlorine Cl (17) - uranium U (92) and a coating analysis range of lithium Li (3) - uranium U (92)Detection limit: 0.005 μ m

5) Humanized closed software, automatic fault diagnosis, prompt correction, and operation steps to avoid misoperation

6) Standard configuration: 0.2mm collimator

7) Equipped with low light concentration technology, the diffusion of the nearest distance measuring spot is less than 10%

application field

instrument parameters