Desktop multifunctional scanning electron microscope

NegotiableUpdate on 12/25

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Langsheng desktop scanning electron microscope, SuperSEM desktop multifunctional real-time energy spectrum scanning electron microscope, equipped with excellent electron optical system, integrates SEM and EDS technology, which can easily achieve deep analysis of sample surface structure and chemical elements. In addition, it is equipped with hardware such as a three-axis sample stage and optical navigation to ensure the performance of the instrument.

Product Details

Langsheng SuperSEM desktop multifunctional real-time spectral scanning electron microscopeEquipped with excellent electronic optical systems,Integrating SEM and EDS technologiesIt can easily achieve in-depth analysis of sample surface structure and chemical elements. In addition, it is equipped with hardware such as a three-axis sample stage and optical navigation to ensure the performance of the instrument.

SuperSEM is equipped with professional data analysis software and an intuitive user interface, allowing users to quickly get started and obtain high-quality scanning electron microscope images. Software supportautofocusandQuick Scan, and combined with video modeReal time observation of sample element distributionThe function not only simplifies the operation process, but also ensures the accuracy and efficiency of image acquisition and analysis. Suitable for material analysis of metals, ceramics, batteries, coatings, cement, and soft materials, it is a powerful assistant for scientific research and industrial testing.

Advantages of use

Real time ingredient information

Unlike traditional scanning electron microscopes, this instrument willEDS is integrated as a detector onto an electron microscopeDevelop an algorithm for synchronously processing BSE video data and EDS spectral data, which can scan and obtain multiple signals while performing element analysis, and detect morphology and various element content information in real time.

One click operation

The software interface is friendly, the operation is simple, and the integrated spotlight does not require manual adjustment of the aperture or frequent electron beam alignment. It can automatically adjust brightness contrast, focus, eliminate astigmatism, and stitch large images with just one click. Enable novice users to quickly get started.

Fast scanning speed

With a signal acquisition bandwidth of up to10M， Fast scanning speedReal time observation of samples in video mode, without ghosting or dragging, without missing any details.

Real time spectrum comparison

Quantitative results can be displayed in real-time without waiting for collection to be completed, and can be compared with previous spectra even during the collection process.

Real time spectral pseudocolor imaging

Real time collection and analysis of sample characteristic X-rays through energy dispersive spectroscopy (EDS), which converts them into pseudo color images and visually displays advanced imaging techniques for element distribution and content.

Backscattered electron detector

Using a high-sensitivity four segment backscattered electron detector, independent imaging and arbitrary signal synthesis can provide rich component information and good environmental adaptability.

Diverse signals

Equipped with various detectors such as secondary electron detectors, backscattered electron detectors, and integrated energy spectrometers.

Fast imaging

Equipped withInfrared CCDSupports fast sample searching and real-time observation of sample compartments, greatly improving the speed of finding and locating samples.

compact size

No need for special equipment rooms or additional shock absorbers, conventional mains power is plug and play.

Application scenarios

Materials Science and Engineering

Nanoscience and Technology

Biological Sciences and Medicine

Earth Science

Criminal Investigation