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E-mail
al@aolongcn.cn
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Phone
18341531533
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Address
No. 66, Aihe Street, Zhenxing District, Dandong City, Liaoning Province
Product Categories
Dandong Aolong Radiation Instrument Group Co., Ltd
Desktop 2D X-ray diffractometer
NegotiableUpdate on 01/01
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Overview
The AL-Y500 diffractometer is the latest desktop two-dimensional X-ray diffractometer launched by Aolong Group. It uses a fixed detector for photography and is different from traditional scanning diffractometers. It is an X-ray array photon counting semiconductor detector with point, line, and plane 0D, 1D, and 2D compatible modes; $r $n is mainly used for phase qualitative and quantitative analysis of polycrystalline samples, including quantitative analysis without standard samples, crystallinity determination, crystal structure analysis, material structure analysis, crystal size determination, structural refinement, microstructure analysis, thin film and texture stress analysis, etc.
Product Details
1、 Instrument features:
The detector is fixed for photography, which is different from traditional scanning diffraction instruments. The photography mode is efficient and fast, about 5-30 times faster than the scanning mode, suitable for in-situ analysis, and collects diffraction information from all angles at the same time; High energy resolution effectively reduces fluorescence background.
The angle measuring instrument uses servo motor drive and optical coding control technology for its θ s and θ d arms. The detector can move in two positions along the 2 θ axis, resulting in smoother rotation of the angle measuring instrument, more accurate diffraction angle measurement, and better linearity. The sample rotates along the θ axis with a control accuracy of 0.01 ° and a 2 θ axis angle accuracy of ± 0.02 °.
Configure multiple detector units to form a detector assembly, uniformly and fixedly distributed along the diffraction circle, with seamless coverage at all angles; Double layer 21 (or single layer 10) array detector, covering a 2 θ range of -3 °~150 °, 2D imaging, while collecting gamma angle information and 2D diffraction data, providing richer information.
X-ray planar photon counting semiconductor detector, highly sensitive, capable of single photon counting, with a large dynamic range and dual thresholds; The point and line light sources are interchangeable, and both Debusseler and BB optical geometry are compatible. The planar and cylindrical samples are compatible, and the detector is compatible with 2D, 1D, and OD modes. And it is resistant to long-term exposure to strong radiation, with a long service life.
The scattered radiation protection device is safer and more reliable. During sample measurement, the radiation protection door automatically prohibits opening, which can prevent operators from being exposed to scattered radiation in any situation.
The compact size can be installed on the experimental bench without the need for a specific laboratory environment. Easy to use, operate and maintain.
2、 Main technical indicators of each part of the equipment
