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Conductive type detector

NegotiableUpdate on 05/06
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Overview

Conductive type detector model: STY-1. The thermal probe of this instrument is equipped with heating and temperature control components, which automatically heat and maintain the temperature within the range of 40-60 ℃. The thermoelectric potential generated by the thermal probe on the semiconductor material is amplified by a low-noise and low drift integrated operational amplifier, and the direction of the model is indicated by a wide surface galvanometer, and the numerical value of the thermoelectric current can be quantitatively measured. The sensitivity of the instrument can be adjusted to a wide range of resistivities (from 1000 Ω #183; Cm high resistance single crystal to 10-4 Ω #183; Distinguish the type of semiconductor material within the range of cm heavily doped single crystal.

Product Details

Conductive model tester Conductive type detector Model:STY-1

The conductivity model tester is strictly in accordance withThe conductivity type identification instrument designed by the thermal probing method in ASTM F42 (Standard Test Method for Conductivity Types of Non Intrinsic Semiconductor Materials).

The thermal probe of this instrument is equipped with heating and temperature control components, which automatically heat and maintain the temperature atWithin the temperature range of 40-60 ℃, the thermoelectric potential generated by the hot and cold probe on the semiconductor material is amplified by an integrated operational amplifier with low noise and low drift. The model direction is indicated by a wide surface galvanometer, and the numerical value of the thermoelectric current can be quantitatively measured. The sensitivity of the instrument is adjustable and can be used in a wide range of resistivity (from 1000 Ω· cm high resistance single crystal to 10)-4Distinguish the type of semiconductor material within the range of Ω· cm heavily doped single crystal.

Conductive type detectortechnical performance

1. The range of resistivity that can distinguish germanium and silicon materials:

Germanium: Non intrinsic germanium~10-4CM

Silicon: 104~10-4CM

Experimental results have shown that this method is reliable for N-type and P-type silicon with resistivity below 1000 Ω· cm at room temperature.

2. Thermal current measurement range: 0 to ± 1 μ A divided into six ranges:

±3nA, ±10nA, ±30nA, ±100nA, ±300nA, ±1μA

Maximum deflection sensitivity:1×10-11A/grid

3. The diameter and length of germanium and silicon single crystals are not limited.

4. Display mode: A wide surface pointer indicator with the center scale at zero position. When the pointer deviates in the positive direction, the measured sample is P-type, and when the pointer deviates in the negative direction, the measured sample is N-type.

5. Probe: Stainless steel recommended in ASTM F42 standard is selected as the probe material, with a 60 ° cone tip and a hot pen temperature automatically maintained within the range of 40-60 ℃. Cold pen is the same as room temperature.

6. Power supply and power consumption: AC 220V ± 10%, 50HZ AC power supply, power consumption less than 10W.

7. Dimensions: 170 × 160 × 230 (mm)

8. Weight: Approximately 2.5kg