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CIS-LIBS Particle Element Analysis System

NegotiableUpdate on 12/20
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Overview
The CIS-LIBS particle element analysis system requires multiple devices to be matched: relying solely on magnification observation cannot determine the composition, and multiple devices or external analysis commissioned are needed.
Product Details


CIS-LIBS Particle Element Analysis SystemFast, accurate, and one click analysis

CIS-LIBS颗粒元素分析系统

CIS-LIBS颗粒元素分析系统CIS-LIBS颗粒元素分析系统

CIS-LIBS颗粒元素分析系统

Multiple devices are required to match:

Merely observing through magnification cannot determine the composition

Need to use multiple devices or commission external analysis


Preprocessing is required:

There are size restrictions on entering the analysis equipment, and it is necessary to destroy or cut off the target object

Need to perform conductivity treatment on the surface of the target object and vacuum treatment inside the analysis equipment


High requirements for the competence of experimenters:

Due to the high professionalism of analytical equipment, only a few people can operate it


Only with professional knowledge can substances be judged based on detected elements

CIS-LIBS颗粒元素分析系统



Only one is needed to complete it

Only one device is needed to quickly perform element discrimination from magnified observation. Personnel who need to perform element discrimination can carry out their tasks on the spot


No preprocessing required

There is no limit on the size of the target object, and it can be analyzed directly without damage

Analyze in air without the need for conductivity or vacuum treatment


Easy element discrimination

While observing with a microscope system, element discrimination can be performed with just one click. Based on the internal database, the detected substance can be inferred instantly


CIS-LIBS颗粒元素分析系统

CIS-LIBS颗粒元素分析系统

CIS-LIBS颗粒元素分析系统

CIS-LIBS颗粒元素分析系统



CIS-LIBS Particle Element Analysis SystemSpecifications


model

CIS- LIBS






LIBS optical module

Detection Principle

Laser induced breakdown spectroscopy

Testing nature

Qualitative and semi quantitative

detection capability

%Level (depending on the element)

Testing environment requirements

None, analysis conducted under atmospheric conditions (none, conducted under normal temperature and pressure conditions)

Corresponding elements

CU、A

SUS、 Fe、 L

C、cr 、Mg、MnN

T

Y. Common elements such as Zn and Au



laser

laser type

Nd: YAG (semiconductor pumped)

laser wavelength

355nm

Single pulse energy

<100UJ

pulse width

≤1 . 5ns

Point specifications

15um (type)

ablation depth

1-10um (depending on the material)



spectrometer

spectral range

200 to 780nm

spectral resolution

0 . 15nm

signal-to-noise ratio

500


detector

CMOS detector


Laser lens

Lens Type

Exclusive specification transmissive lens

Lens magnification

7X

working distance

18mm






Scanning optical module


Incident axis

Differential observation method

Olympus BX53M, BF Bright Field Lighting

objective lens

5X, 10X,20X,50X

optional


lighting

High power digital LED, software controllable, with memory mode

Polarization system

Polarized 00 and Polarized 90o automatic digital switching with memory mode


digital imaging

Camera model

DFK33UX249

camera resolution

1920x1200 (2 . 3mp)

Camera target surface


2 inches

Frame rate

48FPS


Scan the stage

Carrier platform direction

XYZ three-axis

Itinerary scope

Xy axis 125x75mm, z axis 35mm

resolution

0 1um (software control)

precision

<5μm

Control method

Software automatic control+remote rod subdivision control


generate report

generation method

auto-generate

Report content

Single particle material professional report

Full Particle Material Professional Report

computer

15 processor, 16GB memory, 1TB hard drive, 22 inch monitor

equipment power supply

power supply method

AC 220V50Hz

warranty period

Complete machine for 12 months

Environmental resistance

Environmental temperature for use

+10 to 45

Environmental humidity for use

To 85% RH (non condensing)

weight

system

About 50KG

Overall dimensions

Width 490mm x Height 600mm x Depth 840mm


CIS-LIBS颗粒元素分析系统

CIS-LIBS颗粒元素分析系统