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Shanghai Haixiang Instrument Equipment Factory
15 ℃/min rapid temperature change test chamber, humid heat aging chamber
NegotiableUpdate on 05/06
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Overview
15 ℃ per minute rapid temperature change test chamber, humid heat aging chamber. This device is suitable for schools, factories, military industries, research institutions, laboratories, universities, and other units to test the performance indicators, storage, and adaptability of various electronic components in high temperature, low temperature, or alternating high and low temperature environments.
Product Details
15 ℃/min rapid temperature change test chamber, humid heat aging chamber
1、 Product Overview:
This device is suitable for schools, factories, military industries, research institutions, laboratories, universities, and other units to test the performance indicators, storage, and adaptability of various electronic components in high temperature, low temperature, or alternating high and low temperature environments.
2、 Technical parameters:
model/Name |
Fast temperature to humidity test chamber HXKB-500L |
inner dimensions |
800*600*850Mm (width * depth * height) |
temperature range |
－60℃～150℃ |
Alternating cycle temperature |
-50~120℃ |
temperature fluctuation |
±0.2℃ |
rise/Cooling rate |
15℃/min |
humidity range |
20%~98%RH， electronic type |
power supply voltage |
380V/50HZ three-phase |
Overall dimensions |
2010 *1610*1930mm |
power |
49KW |
test hole |
on the leftTwo 100mm test holes for external power cords |
Load partition |
4 pieces/set (maximum load-bearing capacity 50Kg/piece) |
3、 Box structure:
lThe box has a beautiful and elegant shape, processed by CNC machine tools, and adopts non reactive handles for easy operation.
lThe inner liner of the box is made of high-grade stainless steel（SUS304 mirror panel, the box body is made of cold-rolled steel plate electrostatically sprayed, which increases the appearance texture and cleanliness.
lThe large observation window is equipped with lighting to keep the inside of the box bright, and uses tempered glass embedded in the heating body to observe the condition inside the box clearly at any time. There is a test hole on the left side of the box, which can be used for external testing power or signal lines.(The aperture or number of holes must be specified when placing the order).
lThe bottom of the machine adopts high-quality fixed PU movable wheels.
fourCompliant with standards:
lGB-2423.1-89 (IEC68-2-1) Test A: Low temperature test method.
lGB-2423.2-89 (IEC68-2-2) Test B: High temperature test method.
lGJB360.8-87 (MIL-STD-202F) High temperature life test.
lGBJ150.3 (MIL-STD-810D) High temperature test method.
lGJB150.4 (MIL-STD-810D) Low temperature test method.
lGB/T 2423.2-2008 Test B "High temperature test method"
lGB10586-89 Technical Conditions for Low Temperature Test Chamber
lGB/T10592-89 Technical conditions for high and low temperature test chambers
lGB10592-89 Technical Conditions for High and Low Temperature Test Chamber
lGB11158 Technical Conditions for High Temperature Test Chamber
lGB2423.1-89 Basic Environmental Testing Procedures for Electrical and Electronic Products - Test A: Low Temperature Test Method
lGB2423.2-89 Basic Environmental Testing Procedures for Electrical and Electronic Products - Test A: High Temperature Test Method
lIEC60068-2-1.1990 Low temperature test chamber test method
lIEC60068-2.2.1974 High temperature test chamber test method
15 ℃/min rapid temperature change test chamber, humid heat aging chamber
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