The floor standing X-ray diffractometer is mainly used to analyze the crystal structure, texture, and stress state of substances through the principle of X-ray diffraction, and is widely used in materials science, mineralogy, physics, and other fields.
This device can measure the cell parameters (such as interplanar spacing), atomic coordinate positions, as well as the phase composition and crystal orientation distribution of crystal materials. Qualitative and quantitative analysis can be achieved through the position, intensity, and shape of diffraction peaks, which are suitable for various materials such as metals, ceramics, films, and polymers. Equipment equipped with analysis software helps to analyze measurements, view data, and convert data. It can also be transmitted and managed, making it easy to achieve system data integration and sharing. The interface is intuitive, user-friendly, easy to operate, and does not require training. Even non-technical personnel can easily master it.
key component
X-ray generator: High power (such as 9kW), stability better than 0.1%, supports switching of Cu, Mo and other target materials.
Goniometer: Dual axis linkage mechanism, angle positioning accuracy of 0.0025 °, supports scanning within a 2 θ range of 0-145 °.
Detector: High speed one-dimensional silicon array detector with a count rate>4 × 10 ⁶ CPS and background noise<0.2 CPS.
Sample stage: compatible with powder, bulk, and thin film samples, supporting transmission/reflection modes and unconventional testing conditions such as high temperature (room temperature -1200 ℃) and low temperature.
Operation process and precautions
sample preparation
Powder sample: Grind to the micrometer level (pass through a 300 mesh sieve), use back pressure method to slice, and ensure a smooth surface. Block/film: size 1 × 1 cm to 2.4 × 2.4 cm, thickness<1 cm, marked test surface.
Instrument calibration: Use standard substances (such as silicon, Al ₂ O3) to calibrate the angle and intensity, ensuring data accuracy. Perform detector calibration every month, and hardware calibration is required when the angle deviation exceeds 0.0025 °.
Safety Specifications
Experimental environment: Temperature fluctuation ± 0.5 ℃/h, humidity<60%, avoid vibration interference.
Protective measures: Wear protective goggles and gloves, and close the protective door during operation to prevent X-ray leakage.