X-ray fluorescence spectrometer

X-ray fluorescence spectrometer (XRF) is a non-destructive analysis instrument based on the principle of X-ray fluorescence, widely used in the field of element composition detection. The core principle is that high-energy X-rays excite the surface elemental atoms of the sample, causing the inner layer electrons to transition and form holes. When the outer layer electrons fill, characteristic X-ray fluorescence is released, and the fluorescence energy is captured and analyzed by a detector, which can quickly qualitatively and quantitatively detect the types and contents of elements in the sample. XRF has advantages such as non-destructive, fast analysis speed (single detection only takes seconds to minutes), and multi-element synchronous detection. It supports multiple sample forms such as solid, powder, and liquid, and is suitable for industries such as metallurgy, geology, environmental protection, and petrochemicals. It is an important tool for materials science and industrial quality control.