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Shenzhen Tianchuangmei Technology Co., Ltd
Briefly describe the operation process of the film thickness detector specification
Date: 2025-08-21Read: 1
In the fields of electronic manufacturing, automotive coating, aerospace, precision hardware and material research and development, the thickness of coatings, coatings or oxide films directly affects the corrosion resistance, conductivity, appearance quality and service life of products. The film thickness detector achieves non-destructive measurement of single-layer or multi-layer thin films on metal and non-metal substrates through principles such as magnetic method, eddy current method, X-ray fluorescence (XRF), or ultrasound, which is a key link in quality control. To ensure the accuracy, repeatability, and lifespan of measurement results, the film thickness detector must follow scientific and standardized operating procedures.
Step 1: Instrument selection and mode confirmation
Select the appropriate testing method based on the type of film layer and substrate being tested:
Magnetic method: used for non-magnetic coating (such as paint, plastic) on steel substrates;
Eddy current method: used for non-conductive coating on non-ferrous metals (such as aluminum and copper);
XRF method: capable of measuring multi-layer metal coatings (such as Ni Cr, Au Pd Ag) without contact;
Ultrasonic method: suitable for coatings on non-metallic substrates (such as paint on plastics).
After turning on, confirm that the instrument is in the correct measurement mode.
Step 2: Calibration and substrate calibration
Use standard calibration plates (known thickness film or step plates) to calibrate the instrument. If the surface of the substrate is rough or has a large curvature, "zero point correction" or "substrate correction" is required: place the probe on an uncoated homogeneous substrate, perform a zeroing operation, and eliminate the influence of substrate characteristics on the measurement.
Step 3: Environment and Sample Preparation
Ensure that the measurement environment is clean and free from strong magnetic fields or vibrations. The surface of the tested sample should be flat, dry, free of oil stains, dust, or oxide layers. For curved surfaces or small workpieces, choose a suitable probe (such as a small diameter probe) to avoid edge effects.
Step 4: Probe placement and measurement operation
Contact the probe vertically and smoothly with the surface being measured, avoiding tilting or sliding. For handheld instruments, gently press the probe until the instrument prompts a "beep" sound or the screen displays a stable value. Each point can be measured 3-5 times, take the average to improve accuracy. Avoid repeated measurements at the same location to prevent damage to the soft film layer.
Step 5: Data recording and multi-point analysis
Timely record measurement values, some models support automatic storage, statistical analysis (mean, standard deviation, maximum/minimum values), and report generation. For large-area workpieces, perform grid based multi-point measurements according to standard requirements to evaluate the uniformity of film thickness.
Step 6: Cleaning and Instrument Maintenance
After the measurement is completed, clean the surface of the probe with a soft dry cloth to prevent residue from affecting the next measurement. Regularly check the wear of the probe and replace it if necessary. The film thickness detector should pay attention to radiation safety and avoid looking directly at the radiation window. When not in use for a long time, remove the battery and store it in a dry environment.