JXA-8230 Electron ProbeIt is an instrument that uses characteristic X-rays generated by electron beam action on samples for micro area composition analysis, which can be used to analyze the chemical composition of mineral micro areas in thin sections. In addition to a few lighter elements such as H, He, Li, Be, as well as elements after U, qualitative and quantitative analysis can be carried out. The mass production of electron probes uses an extremely narrow electron beam that has been accelerated and focused as a probe to excite a small area in the sample, causing it to emit characteristic X-rays. By measuring the wavelength and intensity of these X-rays, qualitative or quantitative analysis of the elements in that micro area can be performed.

　Structure of JXA-8230 Electron Probe:

The JXA-8230 electron probe X-ray microanalyzer uses a fine focus electron beam of about 1Pm to excite characteristic X-rays of elements in the micro area of the sample surface. Based on the wavelength and intensity of the characteristic X-rays, qualitative or quantitative analysis of the chemical composition of the micro area is performed. The optical system and vacuum system of an electron probe are basically the same as those of a scanning electron microscope, usually equipped with secondary electron and backscattered electron signal detectors, and also have the functions of analyzing tissue morphology and micro area composition. In addition to the host system similar to the structure of a scanning electron microscope, the composition of an electron probe mainly includes a spectroscopic system, a detection system, and other parts.

The JXA-8230 electron probe mainly consists of an electron optical system, an X-ray spectrometer, and an information recording and display system. Electron probes and scanning electron microscopes have similar structures in electron optical systems and are often combined into a single instrument.

　　Advantages of JXA-8230 Electron Probe:

1. Capable of conducting micro area analysis: capable of analyzing the composition of elements within several μ m3.

2. Capable of on-site analysis: Without the need to remove the analysis object from the sample, small areas in large samples can be directly analyzed. By combining an electron microscope with an electron probe, the microstructure and elemental composition observed under the microscope can be correlated.

3. Wide analysis range: Z>4, spectrum: Be-U, energy spectrum: Na-U.

　　The functions and features of JXA-8230 electron probe:

Electron probes can qualitatively or quantitatively analyze the chemical composition of small areas in a sample. Can perform point, line scanning, and surface scanning analysis. It can also perform batch quantitative analysis fully automatically. Due to its advantages of fast and simple operation, straightforward interpretation of experimental results, non-destructive analysis process, and high measurement accuracy, electron probe technology has been increasingly widely used in metallurgy, geology, electronic materials, biology, medicine, archaeology, and other fields. It is an important tool for mineral testing analysis and sample composition analysis.