Super Depth of Field MicroscopeWidely used for observing microorganisms, quality monitoring of semiconductors, and also extended to the electronics, chemical, and pharmaceutical industries. The microscope was invented in the 16th century. Early microscopes used the curvature of convex lenses to work, hence they were called "simple microscopes". They help people discover microorganisms that are invisible to the naked eye. Afterwards, a composite microscope was invented that combines multiple lenses together to increase magnification. A super depth microscope consists of an eyepiece and an objective lens. The combination of these two lenses produces a magnified virtual image of an object.

The super depth of field microscope system also uses optical lenses. Using an optical microscope, objects are observed directly through the eyepiece. The image of the object is captured by a CCD camera and observed on an LCD display.Super Depth of Field MicroscopeThe magnification covers a range from low 0 times to high 5000 times, and has been extended to laboratory and production sites in various industries.

Super Depth of Field Microscope is an integrated high-performance digital microscope that combines all functions of observation, recording, and measurement, integrating advanced features and precise measurement performance. Fast, accurate measurement, and challenging observation of target objects will become standard requirements for observation systems. The integrated microscope system with advanced technology integration has entered a new generation. The design of a super depth of field microscope can meet the needs of every scene from portable on-site observation to high-resolution image capture. Super depth microscopes are widely used in various fields, including research, development, quality assurance, and manufacturing.

A super depth of field microscope can integrate a collective viewing microscope, a tool microscope, and a metallographic microscope, and can observe the microscopic world that traditional optical microscopes cannot see due to insufficient depth of field. The application field of super depth of field microscope can be expanded to between optical microscope and scanning electron microscope (SEM). The super depth of field microscope has circular illumination technology and is equipped with oblique illumination, transmitted light, and polarized light, which can meet the needs of general metallographic photography, macroscopic stereoscopic photography, and non-metallic material photography. It can also capture dynamic microscopic videos, shining brightly.

1、 Fast and realistic observation

Super depth of field microscope achieves a depth of field of over 20 times that of optical microscopy systems. Even large targets with concave and convex shapes that cannot be focused by a microscope system can be observed correctly. Besides,Super Depth of Field MicroscopeIt can also significantly reduce the observation time for focusing.

2、 Ultra high resolution observation

The pixel translation method can provide ultra-high resolution images and has excellent color reproduction; By utilizing the pixel translation method of loading the actuator, the ultra depth of field microscope has achieved a compact lens size and ultra-high image quality for ultra fine observation (with a maximum of 54 million pixels). The wave free line by line scanning method makes the screen display close to visual observation, achieving * color reproduction ability; In the 18 megapixel X 3CCD mode, both color reproducibility and ultra-high precision images have been achieved simultaneously.

3、 Save images on site

The super depth of field microscope saves data to a large capacity HDD and uses a high-speed file management system to manage the data; Use the built-in large capacity 160GB HDD; You can easily record observation images on site. Our high-speed file management system ensures easy processing of large capacity images. The file name, title, organization name, lens and magnification used, and annotations can all be stored for quick image search.