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Shimadzu participates in the National X-ray Diffraction Academic Conference and Diffraction Data Center (ICDD) Seminar
Date: 2018-08-06Read: 0

The National X-ray Diffraction Academic Conference and Diffraction Data Center (ICDD) Seminar, jointly organized by the X-ray Diffraction Professional Committee of the Chinese Physical Society, the Powder Diffraction Professional Committee of the Chinese Crystallographic Society, and the Diffraction Data Center, is a comprehensive academic conference on X-ray diffraction technology. This series of academic conferences is held every three years. This is the 13th edition of the seminar, which was successfully held from July 28th to August 1st at the Lanzhou Organization Building. It attracted more than 400 domestic and foreign X-ray experts, practitioners, and instrument manufacturers to attend, making it a grand event in the industry.

A total of 129 academic reports were arranged for this conference, which were shared and exchanged in the conference and sub conference reports. Among them, four sub venues have been established based on cutting-edge fields, including diffraction theory and methods, new materials and diffraction applications, thin films and low dimensional materials, industrial applications, and others. In addition, to meet the needs of X-ray diffraction practitioners, four specialized training courses were specially arranged, covering residual stress analysis, texture measurement, small angle X-ray scattering, etc., which were highly praised by the attending representatives.

As an instrument manufacturer with over 100 years of history engaged in the research and development, production, and sales of X-ray equipment, Shimadzu Enterprise Management (China) Co., Ltd. was invited to attend this conference. And it brought a full range of X-ray product displays, including X-ray fluorescence spectroscopy technology, electron probe microscopy, X-ray diffraction technology, and X-ray photoelectron spectroscopy technology, which received widespread attention from the attending representatives.

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