The 20th International Society for Microscopy was held at BEXCO in Busan, South Korea from September 10th to 15th this year.

JEOL showcased useful information on new and practical technologies covering various fields at IMC20, and arranged various product information sections: JEM-ACE200F-TEM models for semiconductors, booth seminars, and remote demonstrations. Booth number: S03/04, Hall 1, Exhibition Center 1, looking forward to your visit!

Exhibition equipment

JSM-IT800 remote demonstration

JCM-7000

Gather-X JED Series DrySD™ Windowless EDS

Exhibition booth seminar

Invited Report 1

Tuesday, 12 September, at 1:00PM

A journey of Cryo-EMing in Korea

Ji-Joon Song Professor

Department of Biological Sciences

Korea Advanced Institute of Science and Technology (KAIST)，Daejeon, Korea

Invited Report 2

Wednesday, 13 September, at 1:00PM

MARS -Exploration of the Nanomagnetic World-

Naoya Shibata Professor

Director, Institute of Engineering Innovation，The University of Tokyo

Remote demonstration

JEM-ACE200F High Throughput Analytical Electron Microscope