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Juli Optoelectronics (Beijing) Technology Co., Ltd
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Juli Optoelectronics (Beijing) Technology Co., Ltd

  • E-mail

    info@giantforce.cn

  • Phone

    18911365393

  • Address

    1311, Building B, Wanda Plaza, No. 58 Xinhua West Street, Tongzhou District, Beijing

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Brief Introduction


This video demonstrates how to make a photoelectrochemical cell into a single emitting organic layer sandwiched between two electrodes, thereby achieving cost-effective lighting applications. Ideal devices are usually considered as p-i-n structures with doped regions on the electrodes, which facilitate the balance of hole and electron injection. Here, we first introduce a method based on spectral photocurrent response measurement combined with optical modeling to determine the center of the intrinsic region in interlayer LECs. Combined with capacitance measurement, generate detailed images of the evolution of p-i-n structure. Secondly, the angle dependent emission spectrum emission region is determined through simulation experiments.



Phelos OLED Spectral Measurement System/Angular Spectral Analyzer

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Phelos is used to measure the emission spectral characteristics and polarization angles of OLEDs, perovskite LEDs, and other light-emitting devices. It can also measure the s and p polarization spectra of the devices, the relationship between emission spectra and angles, and calculate the emission angle and position distribution of excitons in the emitting layer.


PL measurement function:Emission spectra and polarization angles of organic, quantum dot, and perovskite thin films

EL measurement function:OLED、 Perovskite LEDs and other light-emitting devices



Setfos simulation software

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Setfos is a simulation system used for various types of solar cells (including perovskite, organic, stacked, silicon-based cells, etc.), perovskite LEDs, OLED devices, and related optoelectronic material properties. It simulates and optimizes device design, construction, optical performance, electrical performance, and optoelectronic material properties.


Four modules: absorption module, scattering/advanced optics module, drift diffusion module, and light emission module


Paios Solar Cell/OLED Transient Characteristics Testing System

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Paios is used for measuring and analyzing transient photocurrent spectra (TPC), transient photovoltage spectra (TPV), light intensity correlation testing, deep level transient spectra (DLTS), and other performance parameters of solar cells. It comprehensively and deeply characterizes the carrier mobility, carrier lifetime and concentration, carrier dynamics, doping, and trap distribution of the devices, thereby conducting comprehensive and effective analysis and measurement of carrier mobility in solar cells/OLED devices and other organic semiconductors.


Paios testing function:

Transient photocurrent spectroscopy TPC

Transient Photovoltage Spectroscopy (TPV)

• Open circuit voltage decay OCVD

• Light intensity correlation test, variable light intensity J-V curve, Isc light intensity, Voc light intensity, ideal factor, etc

Linear Boost Carrier Extraction: Photo CELIV, Dark CELIV, Delaytime CELIV, etc

• Charge extraction CE

• Dark injection DIT

Intensity modulated photocurrent spectroscopy IMPS

Intensity modulated photovoltage spectroscopy (IMVS)

Impedance spectroscopy IS

• Capacitive voltage spectrum CV

Deep level transient spectrum DLTS

• Transient electroluminescence spectrum TEL

Current voltage luminescence spectra J-V-L, etc

• Variable temperature test bench: -120 ° C to 150 ° C