Welcome Customer !

Membership

Help

Juli Optoelectronics (Beijing) Technology Co., Ltd
Custom manufacturer

Main Products:

instrumentb2b>Video
Video

Juli Optoelectronics (Beijing) Technology Co., Ltd

  • E-mail

    info@giantforce.cn

  • Phone

    18911365393

  • Address

    1311, Building B, Wanda Plaza, No. 58 Xinhua West Street, Tongzhou District, Beijing

Contact Now
Brief Introduction


This video discusses that organic light-emitting diodes (OLEDs) are multi-layer devices in which several different physical processes occur simultaneously. For example, simple models and analytical formulas for extracting charge carrier mobility can only be used within a limited range. That is one of the reasons why we develop and utilize software simulations combined with advanced characterization devices.



Phelos OLED Spectral Measurement System/Angular Spectral Analyzer

图片


Phelos is used to measure the emission spectral characteristics and polarization angles of OLEDs, perovskite LEDs, and other light-emitting devices. It can also measure the s and p polarization spectra of the devices, the relationship between emission spectra and angles, and calculate the emission angle and position distribution of excitons in the emitting layer.


PL measurement function:Emission spectra and polarization angles of organic, quantum dot, and perovskite thin films

EL measurement function:OLED、 Perovskite LEDs and other light-emitting devices



Setfos simulation software

图片


Setfos is a simulation system used for various types of solar cells (including perovskite, organic, stacked, silicon-based cells, etc.), perovskite LEDs, OLED devices, and related optoelectronic material properties. It simulates and optimizes device design, construction, optical performance, electrical performance, and optoelectronic material properties.


Four modules: absorption module, scattering/advanced optics module, drift diffusion module, and light emission module


Paios Solar Cell/OLED Transient Characteristics Testing System

图片


Paios is used for measuring and analyzing transient photocurrent spectra (TPC), transient photovoltage spectra (TPV), light intensity correlation testing, deep level transient spectra (DLTS), and other performance parameters of solar cells. It comprehensively and deeply characterizes the carrier mobility, carrier lifetime and concentration, carrier dynamics, doping, and trap distribution of the devices, thereby conducting comprehensive and effective analysis and measurement of carrier mobility in solar cells/OLED devices and other organic semiconductors.


Paios testing function:

Transient photocurrent spectroscopy TPC

Transient Photovoltage Spectroscopy (TPV)

• Open circuit voltage decay OCVD

• Light intensity correlation test, variable light intensity J-V curve, Isc light intensity, Voc light intensity, ideal factor, etc

Linear Boost Carrier Extraction: Photo CELIV, Dark CELIV, Delaytime CELIV, etc

• Charge extraction CE

• Dark injection DIT

Intensity modulated photocurrent spectroscopy IMPS

Intensity modulated photovoltage spectroscopy (IMVS)

Impedance spectroscopy IS

• Capacitive voltage spectrum CV

Deep level transient spectrum DLTS

• Transient electroluminescence spectrum TEL

Current voltage luminescence spectra J-V-L, etc

• Variable temperature test bench: -120 ° C to 150 ° C