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E-mail
lu.yan@leboscience.cn
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Phone
13584134215
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Address
5th Floor South, Building A, Chuangzhi Industrial Park, 201 Jinshan Road, Jiangyin, Jiangsu
Jiangsu Leibo Scientific Instrument Co., Ltd
lu.yan@leboscience.cn
13584134215
5th Floor South, Building A, Chuangzhi Industrial Park, 201 Jinshan Road, Jiangyin, Jiangsu

Compared to the spin coating method, the perovskite thin films prepared by the scratch coating method usually have poorer morphology, which affects the efficiency and stability of solar modules (PSM). To this end, the team from the Institute of Chemistry of the Chinese Academy of Sciences introduced polymer additives into perovskite precursors and customized elliptical colloidal structures(In the experiment, the PF200 in-situ scraping and coating equipment of the Leibo instrument was used)The results were published in Advanced Materials.



PF200 (in-situ scraping) equipment:
A miniature coating device that can be used for synchrotron radiation in-situ observation platform. The push rod can adsorb silicon wafers or other forms of cutting heads for coating, and the coating height can be adjusted.

a) Schematic diagram of the coating process for perovskite thin film blades.
b) Elliptical spherical colloids in wet filmc) Schematic diagram of stacking spherical colloids and corresponding perovskite films.
d) Elliptical spherical colloid ande) SAXS spectra of spherical colloidal perovskite precursor solution.
f) Elliptical spherical colloidal precursor liquid andg) In situ GIWAXS spectroscopy of the formation process of perovskite thin films coated with spherical colloidal precursor solution.
h) Perovskite thin films coated with elliptical spherical colloidal precursor solution andi) The (110) plane related azimuthal evolution of perovskite thin films coated with spherical colloidal precursor solution was obtained by in situ GIWAXS spectral integration.
j) Elliptical spherical colloidal precursor liquid andk) 2D-GIWAXS patterns of perovskite thin films coated with spherical colloidal precursor solution after thermal annealing.

a) The evolution of average grain size during blade coating process.
b) Schematic diagram of LaMer for the nucleation and growth model of perovskite.
c) DLS diameter in perovskite precursor solution.
d) PCE of PSCs coated with perovskite thin films using blade coating based on different polymer concentrations.
e) Azimuthal integration of (100) scattering characteristics of perovskite films with different polymer concentrations.
f) Cross sectional SEM images of perovskite films coated with spherical colloidal precursor and g) elliptical spherical colloidal precursor.
h) Colloidal deposition simulation of spherical colloids, i) elliptical spherical colloids, and j) excessively large elliptical spherical colloids.

a) UV visible and PL spectra of perovskite thin films coated with elliptical spherical colloids and precursor solutions of spherical colloids.
b) TRPL spectra of perovskite thin films coated with elliptical spherical colloids and precursor solutions of spherical colloids.
c) The dark J-V characteristics of hole only and d) electron only diodes in perovskite thin films coated with elliptical spherical colloids and spherical colloidal precursors for SCLC analysis.

a) Cross sectional SEM image of PSC coated with blades.
b) The J-V characteristics of PSC.
c) EQE spectrum.
d) Steady state photocurrent and efficiency of PSC at MPP.
e) Optical photos of PSM.
f) J-V characteristics of PSM.
g) The storage stability of PSM.
h) MPP tracking stability of PSM.
After optimizing the morphology of the thin film, the device performance significantly improved: 0.09 cm ² PSC efficiency24.31%, 13.94 cm ² PSM certification efficiency21.37%And maintain it after 600 hours of work89%Initial efficiency.