Full spectrum ICP mass spectrometerUsually refers to time-of-flight inductively coupled plasma mass spectrometry, which is a high-throughput elemental analysis technique based on time-of-flight mass analyzers.
Working Principle:
1. Sample ionization: The sample enters a high-temperature plasma through an atomizer and rapidly evaporates, atomizes, and ionizes in a high-temperature environment, producing a large amount of ions.
2. Ion extraction and separation: The ionized ions are extracted into a vacuum system through an interface cone and enter a time-of-flight mass analyzer.
3. Mass separation and detection: Ions enter the field free drift tube with the same kinetic energy after being accelerated by an electric field. Ions with smaller mass have shorter flight time, while those with larger mass have longer flight time. By detecting differences in flight time, mass separation can be achieved, and a single pulse can capture ion signals across the entire mass range.
4. Data processing: The high-speed digital converter records the arrival time of all ions, and combines it with the calibration curve to convert the time into mass to charge ratio (m/z), generating a complete mass spectrum.
Full spectrum ICP mass spectrometerAdvantages:
Full spectrum synchronous acquisition: A single pulse can capture ion signals across the entire mass range, avoiding time delay in quadrupole scanning and significantly improving analysis efficiency.
High sensitivity: capable of detecting elements at lower concentrations, with a detection limit of up to nanograms per milliliter or lower.
Wide dynamic range: The linear range can reach multiple orders of magnitude, suitable for simultaneous determination of multiple elements, including high and low concentration elements.
Low interference and low background: By carefully designing and optimizing the instrument structure, as well as adopting good interference correction techniques, the impact of interference and background signals is effectively reduced.
Simultaneous analysis of multiple elements: Multiple elements can be analyzed simultaneously, and the width of the measurable element surface can be determined.