X-ray emission spectrometerX-ray Emission Spectrometer is a scientific instrument that detects characteristic X-rays emitted by a substance after excitation, enabling qualitative and quantitative analysis of elements and study of material structure. Its core principle is based on the characteristic X-rays generated by electron transitions in the inner layer of atoms, which have advantages such as high sensitivity, non-destructive nature, and simultaneous detection of multiple elements.
X-ray emission spectrometerApplication Scenario:
Materials Science
Catalyst characterization: Tracking the dynamic evolution of the active center structure in electrocatalytic reactions. For example, the team from the University of Science and Technology of China utilized millisecond level time-resolved ED-XAFS technology to capture the deprotonation process of nickel iron hydroxide in oxygen evolution reactions and the generation of high valence Ni ³ ⁺ δ species.
Alloy composition analysis: Quickly determine the content of major and trace elements in metal materials to guide process optimization.
Geological Exploration and Mineral Analysis
Ore grade identification: XRF (X-ray fluorescence spectrometer) can non-destructive detect the content of rare earth elements in ores, such as the "Haike Guardian K5" portable XRF instrument used for customs rare earth export control.
Mineral phase analysis: Combining the high-resolution advantage of WDS (wavelength dispersive X-ray spectrometer) to distinguish the distribution of trace elements in minerals.
environmental monitoring
Atmospheric particulate matter analysis: XRF is one of the three major methods for PM2.5 element analysis, which can simultaneously detect more than 20 elements such as Al, Si, S, Cl, etc.
Soil pollution assessment: rapid screening of areas contaminated with heavy metals (such as Pb, Cd, As).
Industrial quality inspection
Lithium battery testing: XRF is used for element quantification of positive electrode materials in ternary batteries to avoid abuse and explosion, ensuring service life.
Semiconductor manufacturing: detecting metal contamination on wafer surfaces and controlling yield.
5、 Technological development trends