X-ray Fine Structure Analysis SpectrometerXAFS is an analytical instrument used to study the local geometric and electronic structures of matter. Its core principle is to measure the variation of X-ray absorption coefficient with incident photon energy, and to analyze structural information such as the type, bond length, and coordination number of neighboring coordinating atoms around the absorbing atom.

　　X-ray Fine Structure Analysis SpectrometerApplication areas and typical cases:

Research on catalytic materials

Case: Professor Wang Zhongli's team from Tianjin University used XAFS to characterize CuOx/V2O5 composite catalysts and found that the valence state of Cu is between 0 and+2, and there is a strong interaction between monodisperse CuOx species and V2O5 support. They successfully oxidized methane to formic acid (Faraday efficiency of 92%).

Development of Energy Materials

Case: The Fudan University team used XAFS to analyze the [MN4] coordination structure of metal phthalocyanine (MPc) materials and found that NiPc can oxidize ethylene to 2-bromoethanol in a bromine containing electrolyte, thereby synthesizing triethanolamine, providing a new pathway for CO2 electrocatalytic reduction to C6 product.

Analysis of Amorphous Materials

Case: The team of the Chinese Academy of Sciences Shanghai Institute of Applied Physics used XAFS to study the two-dimensional MXene material prepared by molten salt electroetching, and found that the Ti local structure of Ti3C2Tx was consistent before and after etching, but Ti was oxidized, and the – O functional group modified Ti3C2 showed excellent electrochemical performance in 1 M H2SO4 solution.

Environmental pollutant detection

Case: The team from Donghua University of Technology used XAFS to analyze the uranium organic framework structure and found that 1,3,5-tricarboxyl (H3TFP) can form a stable planar coordination structure with uranium, achieving 100% adsorption of uranium in solution and providing a new method for nuclear waste treatment.