Recently, Yangzhou Xiaotian Photon Technology Co., Ltd. (hereinafter referred to as "Xiaotian Photon") successfully introduced the flagship equipment Phenom ProX G6 scanning electron microscope energy spectrum analyzer under the desktop scanning electron microscope - Feina Electron Microscope, and successfully completed installation and acceptance, officially put into use. This marks a crucial step for Xiaotian Photon in the field of material characterization, injecting strong microscopy technology into the research and development of optical materials.

Innovation driven optical materials pioneer moves towards higher precision era

As an outstanding representative of high-tech enterprises in East China, Xiaotian Photon has always focused on the research and manufacturing of precision optical coating materials, laser crystal components, and fiber optic sensing core devices. Its products are widely used in high-precision fields such as quantum communication and biomedical detection. As the precision of the company's products continues to move towards the sub micron level, the demand for extreme testing of material surface morphology, composition uniformity, and defect analysis is becoming increasingly urgent. The landing of Phenom ProX G6 undoubtedly brings a significant upgrade to the material characterization capability of Xiaotian Photon, helping the company to further advance on the path of optical material research and development.

The Phenom ProX G6 integrated electron microscopy spectrometer, with its "nano insight x industrial efficiency" as its core, provides a revolutionary solution for Xiaotian Photon and brings four major values:

Part 01: Dual advantages of high resolution and low voltage

• 6nm ultra clear imaging capability, capable of accurately capturing microscopic features such as interlayer structure and crystal growth defects in optical coatings, making every detail of the material clear and visible.

• In low voltage mode, non-conductive materials can be directly observed without pre-treatment, effectively avoiding damage to the sample during the detection process and ensuring the accuracy and reliability of the detection results.

Flyna electron microscope backscattered electron image

Part 02. Original Factory Integrated EDS: Intelligent Spectrum Revolution

• The factory integrated ultra high speed large-area surface scanning EDS can complete the analysis of coating composition distribution in just 30 seconds, improving detection efficiency by 400% and greatly accelerating the research and development process.

• The intelligent element tracking system can automatically mark impurity particles, providing strong support for material purity control and helping Xiaotian Photon further improve product quality.

Mapping results of energy spectrum of Feina electron microscope

Part 03. Industrial Efficiency: The Choice for Enterprises to Accelerate Research and Development

• The fully automatic high-definition large field puzzle technology can complete traditional electron microscopy panoramic imaging for 6 hours in 15 minutes, greatly reducing detection time and improving production efficiency.

• The airlock type sample chamber achieves a detection flux of 60 samples per hour, meeting the high-throughput requirements of Xiaotian Photon for material detection in large-scale production and providing strong support for the company's capacity expansion.

• Intelligent operation experience - one click automation function, everyone can get started after 30 minutes of training, greatly reducing the operating threshold and improving research and testing efficiency.

Part 04: Paradigm of R&D Laboratory

The 0.5m desktop design not only frees up laboratory space, but also makes the layout of equipment more flexible, making it easy to collaborate with other R&D equipment.

The energy consumption is only 20% of that of traditional electron microscopes, greatly reducing operating costs and in line with Xiaotian Photon's pursuit of a green and efficient research and development environment.

The cloud based data management system supports collaborative analysis among multiple departments, including R&D and production lines, breaking down information barriers between departments, promoting knowledge sharing and team collaboration, and further enhancing the overall R&D efficiency of the company.

Phenom ProX Integrated Electron Microscopy and Spectroscopy Machine

The successful landing of Phenom ProX G6 electron microscope has brought opportunities for the research and development of optical materials by Xiaotian Photon. In the future, Xiaotian Photon will fully utilize the powerful functions of Phenom ProX G6 to further enhance the level of material characterization, accelerate the product development process, and provide higher quality and more advanced optical material products for fields such as quantum communication and biomedical detection. At the same time, Xiaotian Photon will also maintain close cooperation with Feina Electron Microscopy to explore more innovative applications, promote the development of the optical materials industry, and contribute to the progress of China's high-tech industry.

Funa Electron Microscopy - Funa Scientific Instruments (Shanghai) Co., Ltd., founded in Shanghai in 2012, provides desktop scanning electron microscopes for universities, enterprises, and research institutes. Its product line is rich: desktop Schottky thermal field emission scanning electron microscopy, CeB filament XL series intelligent desktop scanning electron microscopy, CeB filament P series cost-effective desktop scanning electron microscopy, ParticleX series fully automatic particle and foreign object detection scanning electron microscopy, DiatomAI fully automatic diatom detection system (electron microscopy method), and scanning electron microscopy sample preparation equipment - ion grinder, etc.

Feina Electron Microscopy also provides technical support and testing services related to desktop scanning electron microscopy. Testing centers and after-sales service centers have been established in Shanghai, Beijing, Guangzhou, and Chengdu. Currently, Feina Electron Microscopy has over 2000 users in China.

Feina Electron Microscopy also provides technical support and testing services related to desktop scanning electron microscopy. Testing centers and after-sales service centers have been established in Shanghai, Beijing, Guangzhou, and Chengdu. Currently, Feina Electron Microscopy has over 2000 users in China.