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Funa Scientific Instruments (Shanghai) Co., Ltd

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Webinar | SEM/TEM Ion Beam Sample Preparation New Technologies: Ion Grinding Instrument, Ion Refinement Instrument, Ion Thinning Instrument
Date: 2025-10-13Read: 0

With the continuous advancement of electron microscopy technology, how to efficiently and accurately prepare high-quality thin films has become an important issue in the fields of materials science and nanotechnology. As a commonly used method for preparing thin films, focused ion beam (FIB) technology is widely used, but it involves the use of high-energy ions and Ga during use, which may introduce unnecessary ion implantation. To overcome this limitation, wide ion beam (BIB) technology has gradually gained attention and demonstrated its advantages in reducing damage and improving sample quality.

In order to better understand and apply BIB technology, we sincerely invite you to participate in this special seminar.

Part.1.Meeting Details

meeting time

October 17, 2025 (Friday) 10:00-12:00

Participation Method

Online participation

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We look forward to your participation in exploring cutting-edge technologies and working together to promote innovative development in materials science! Participate in online seminars, interact in live streaming rooms, and receive high-quality gifts!

网络研讨会|SEM/TEM离子束制样新技术:离子研磨仪,离子精修仪,离子减薄仪

Welcome to obtain more product details and application cases.