Scanning electron microscopy in-situ techniqueIt has been widely applied in various fields of materials science research, which can link the macroscopic properties of materials with their microstructure, which is very helpful for the development of high-performance new materials. But in situ electron microscopy experiments are never a simple task, and sometimes even require some luck.

In order to make in situ electron microscopy experiments more intelligent and efficient, Zeiss has recently launched a scanning electron microscopy in situ solution. Today, let's take a look at the cutting-edge technologies of Zeiss' in-situ solution together!

Highly integrated: Say goodbye to being flustered and disorganized

Zeiss scanning electron microscopy in situ solution

Zeiss scanning electron microscopy in situ solution combines scanning electron microscopy, in-situ sample stageEBSDandEDSDeep integration of control software in a single devicePCAll hardware can be controlled in one software, achieving high integration of imaging, analysis, and in-situ sample stage parameter settings.

Pioneering automated experimental process: saving time and freeing hands

Different stainless steel samples during in-situ stretching processROIofSEandBSEImage（AsBThe detector observed the formation of slip bands.

Zeiss in-situ electron microscopy solution can achieve automated in-situ experimental workflow. The integrated software can not only automatically control the stress loading of the sample stage, but also set multiple areas of interest（ROI）And for differentROIPerform automatic tracking, automatic focusing, and automatic image acquisition. differentROIThe imaging parameters can be independently set, and the system can also recognize the fracture state of the sample and automatically terminate the experiment.

From now on, in-situ experiments will become automated and intelligent, reducing manual operation time, significantly improving testing efficiency, and can achieve up to24Hour by hour unmanned automated testing can fully utilize nighttime time, greatly improving the utilization rate of electron microscopes.

Automatically obtain EBSD and EDS data: obtain comprehensive information about the sample

800°CLower heating17 Automatically collect a series of steel samples for hoursEBSDThe image displays the changes in grain boundaries and grain orientation.

The processing software of this new solution not only automatically acquires images, but also incorporatesEBSDandEDSAutomatic acquisition function, capable of tracking and obtaining samples at the same locationEBSDandEDSAnalyze the results and comprehensively analyze the process of material changes.

Data acquisition and processing: high throughput, high quality, and high efficiency

Low carbon steel sample with surface polishing(S235JRC)Small particles on the surface of the sample are used forDICMarking related to digital images.SEImage importedGOMAssociated softwareDICanalyze The amplitude and direction of the main strains can be displayed in the image.

Automated and efficient testing means that a large amount of experimental data can be obtained, without missing any details of sample changes, and statistically significant results can be obtained. The reduction of manual intervention factors can also greatly improve experimental reproducibility and data reliability.

Of course, Zeiss field emission scanning electron microscopeGEMINITechnology is also a powerful guarantee for obtaining high-quality and high-resolution data. This plan is also equipped withZEISS-GOMAssociated software that can perform digital image correlation on data（DIC）Process and study the surface strain distribution of the sample.

Zeiss scanning electron microscopy in situ solution integrates electron microscopy, in-situ stageEBSDandEDSSoftware control is used to add highly automated functions during in-situ heating and tensile experiments, enabling automatic observation of the changes in materials such as metals, alloys, polymers, plastics, composite materials, and ceramics under high temperature and external forces while dynamically drawing stress-strain curves.

Liberate your hands and make in-situ experiments simple and efficient! Scan the QR code to read 'Zeiss microscope'（ZEISSMIK）Leave a message for more timely and effective detailed information, continue to follow us. Regarding the in-situ solution for Zeiss scanning electron microscopy, Zeiss Jun has more information that will be released gradually~