Do you always encounter the following problems while using scanning electron microscopy:

When switching samples between different devices, it always takes a lot of time to reposition the area of interest

2. Always struggling to obtain high-resolution images of large areas, requiring frequent switching of imaging parameters and adjustment of astigmatism focus

3. After obtaining the image, they are worried about the quantitative analysis of the image

In response to the above difficulties and needs, Zeiss has equipped scanning electron microscopy with new technology and launched an intelligent electron microscopy solution to solve all the problems mentioned above, ensuring smooth and efficient daily detection and analysis work.

Association positioning analysis

The Zeiss Connect module easily bridges optical microscopes to scanning electron microscopes, enabling quick repositioning of samples between different devices and unified management of associated device data and information

✓ Association positioning: By associating the sample stage, the sample can be automatically associated and repositioned between different microscope devices, greatly reducing the operation time

✓ Data overlay: Free overlay of information from mobile phones, optical microscopes, scanning electron microscopes, and related spectral information

✓ Unified management: Manage data from different associated devices, output different information, overlay images and videos

Microscopic analysis of PCB circuit board correlation (light microscope, electron microscope, energy spectrum information), left: macroscopic image; Right: Local magnification of the area of interest

Automatic imaging

Zeiss SmartSEM Touch customized software comprehensively considers parameter settings, imaging, automated jigsaw puzzles, image browsing, achieving intelligent and efficient scanning electron microscopy imaging

✓ Guided operation process, simple interface, easy operation

✓ Intelligent matching of imaging parameters based on samples to achieve automatic focusing

✓ Simple operation to complete high-throughput image capture and stitching

Concise SmartSEM Touch interface

quantitative analysis

The Zeiss ZEN module implements the entire quantitative analysis process from electron microscopy image acquisition, image processing, image segmentation, automatic measurement to report generation

✓ One click acquisition of scanning electron microscopy images, guided analysis workflow, easy for inexperienced beginners to master

✓ Machine learning based ZEN Intellesis module easily achieves image processing requirements that are difficult to achieve with traditional thresholding methods

✓ Rich measurement functions, such as particle statistical analysis, porosity, content percentage, layer thickness measurement, grain size rating, etc

Quantitative Analysis Interface - Binary Segmentation

Analysis of Pore Size and Content in Metal Welding Positions

Meeting various measurement needs - advanced measurement

Content percentage

Grain size rating

Particle analysis

Porosity analysis

ZEISS's intelligent scanning electron microscope solutions can meet your various needs. You can follow ZEISSMIK's WeChat official account to learn about ZEISS's intelligent scanning electron microscope solutions in life science, material science, metal industry and electronic industry.