Welcome Customer !

Membership

Help

Nats (Suzhou) Technology Co., Ltd
Custom manufacturer

Main Products:

instrumentb2b>Products

Nats (Suzhou) Technology Co., Ltd

  • E-mail

    info@nators.com

  • Phone

    18912649212

  • Address

    Suzhou High Speed Rail New City Yangtze River Delta International R&D Community Launch Zone

Contact Now

nanoindenter

NegotiableUpdate on 01/29
Model
Nature of the Manufacturer
Producers
Product Category
Place of Origin
Overview
Product Introduction: NMT Nanoindentation Tester, capable of providing real-time characterization and observation of the mechanical properties of micro/nano scale materials under optical and electron microscopes
Product Details

Product Introduction

The NMT nanoindentation instrument can provide real-time characterization and observation of the mechanical properties of micro/nano scale materials under optical and electron microscopes. Through high-resolution force sensors, displacement sensors, and automatic control methods, the depth and load data of the material surface being pressed during the mechanical performance characterization testing process can be recorded, forming a force displacement curve.

Product Features

  • High precision force and displacement measurement

  • Multiple force sensors and shapes to cope with various mechanical properties of materials

  • Compatible with various mainstream optical microscopes and scanning electron microscopes

Product Application

压痕仪产品特性.png
Nanoindentation testing Stretching and Compression Testing Nano manipulation and assembly

Specifications

force sensor Sensor A Measurement resolution 1 nN
measurement range +/- 50 uN
AFM silicon probe
Sensor B Measurement resolution 1 uN
measurement range +/- 20 mN
Diamond; customizable
Sensor C Measurement resolution 10 uN
measurement range +/- 500 mN
Diamond; customizable
sample stage standard module sports platform XYZ
range of motion 10x10x10 mm
motion resolution 1 nm
Encoder resolution 2 nm
Indentation table standard module Displacement range 8 um
Displacement resolution 0.02 nm
background noise 0.2 nm