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Hangzhou Kefu Electromechanical Equipment Co., Ltd
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Hangzhou Kefu Electromechanical Equipment Co., Ltd

  • E-mail

    13967146609@126.com

  • Phone

    13967146609

  • Address

    3rd Floor, Building A, 3778 Jiangnan Avenue, Binjiang District, Hangzhou City, Zhejiang Province

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energy spectrometer

NegotiableUpdate on 01/22
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Overview
When moving samples, real-time display of element surface distribution images can also be achieved with high sensitivity and spatial resolution, reducing sample damage and contamination. The Ultim Max series features large-area SDD and Extreme integrated circuits capable of detecting Li elements.
Product Details

Real time electronic image and element distribution image presentation

uSynchronize the presentation of electronic images and element distribution maps, without the need for frequent switching between the two


Flexible recording

uWhen scanning samples quickly, a slight pause can obtain high-quality element distribution maps

Path record

uAutomatically record location information and corresponding element information, without missing any interesting features

uPresent the distribution of element content with different brightness levels, making it clear at a glance

uSelect the location of interest and return with one click

Ultim@Max Provide hardware support

uThe large-area spectral efficiency is good, which is the hardware guarantee for obtaining real-time element surface distribution maps

Ultim ® The Max probe adopts a larger SDD crystal and a highly sensitive Extreme integrated circuit

uLarger effective area of crystals(40mm²,65mm²,100 mm²,170mm²)Guaranteed high count rate in all situations

ulow noiseX-ray detection provides the most accurate results for accurate quantification at counting rates up to 400 kcps

uThe qualitative analysis count rate is higher than1000 kcps

The crystal area has a significant impact on the results

uand10mm²Compared to other probes, when analyzing the same area under the same conditions, you can use170mm²detector:

uShorten the time to the original1/17

uFor beam sensitive samples, the beam current is only the original6% can reduce sample damageReduce sample carbon pollution

Make the analysis of difficult samples simple

uLow voltage performanceNanomaterials, non-conductive samples, less sample damage

uHigh sensitivityLight elements and nanomaterials

uimproveThe ability of SEM-EDS to analyze light elements and nanomaterials

uUltim Extreme windowless energy spectrum exhibits low energy X-ray sensitivity at low voltage

Different areas, same energy resolution

uallUltim @ Max detectors all have the same energy resolution

uMn Ka ensures energy resolution of 127eV @ 130000cpsFKa ensures energy resolution 64eV@130 , 000cps

uCKa ensures energy resolution 56eV@130 , 000cps