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E-mail
13967146609@126.com
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Phone
13967146609
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Address
3rd Floor, Building A, 3778 Jiangnan Avenue, Binjiang District, Hangzhou City, Zhejiang Province
Hangzhou Kefu Electromechanical Equipment Co., Ltd
13967146609@126.com
13967146609
3rd Floor, Building A, 3778 Jiangnan Avenue, Binjiang District, Hangzhou City, Zhejiang Province
Real time electronic image and element distribution image presentation
uSynchronize the presentation of electronic images and element distribution maps, without the need for frequent switching between the two
Flexible recording
uWhen scanning samples quickly, a slight pause can obtain high-quality element distribution maps
Path record
uAutomatically record location information and corresponding element information, without missing any interesting features
uPresent the distribution of element content with different brightness levels, making it clear at a glance
uSelect the location of interest and return with one click
Ultim@Max Provide hardware support
uThe large-area spectral efficiency is good, which is the hardware guarantee for obtaining real-time element surface distribution maps
Ultim ® The Max probe adopts a larger SDD crystal and a highly sensitive Extreme integrated circuit
uLarger effective area of crystals(40mm²,65mm²,100 mm²,170mm²)Guaranteed high count rate in all situations
ulow noiseX-ray detection provides the most accurate results for accurate quantification at counting rates up to 400 kcps
uThe qualitative analysis count rate is higher than1000 kcps
The crystal area has a significant impact on the results
uand10mm²Compared to other probes, when analyzing the same area under the same conditions, you can use170mm²detector:
uShorten the time to the original1/17
uFor beam sensitive samples, the beam current is only the original6% can reduce sample damage,Reduce sample carbon pollution
Make the analysis of difficult samples simple
uLow voltage performanceNanomaterials, non-conductive samples, less sample damage
uHigh sensitivityLight elements and nanomaterials
uimproveThe ability of SEM-EDS to analyze light elements and nanomaterials
uUltim Extreme windowless energy spectrum exhibits low energy X-ray sensitivity at low voltage
Different areas, same energy resolution
uallUltim @ Max detectors all have the same energy resolution
uMn Ka ensures energy resolution of 127eV @ 130000cpsFKa ensures energy resolution 64eV@130 , 000cps
uCKa ensures energy resolution 56eV@130 , 000cps