Xenon lamp pulse solar simulator (laboratory)

NegotiableUpdate on 02/09

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

The xenon lamp pulse solar simulator (laboratory) can be used for measuring I-V curves, P-V curves, irradiance lines, short-circuit current, open circuit voltage, peak power, peak power point voltage, current, fill factor, conversion efficiency, series resistance, parallel resistance and other parameters of conventional polycrystalline, single-crystal PERC, TopCon, heterojunction, CIGS, GaAs, CdTe and IBC battery components.

Product Details

Xenon lamp pulse solar simulator (laboratory) is a device used to simulate sunlight and collect the volt ampere characteristic curve of crystalline silicon photovoltaic cells. It generally consists of a light source system, a power supply system, an acquisition system, an infrared temperature probe, a reference battery, a display, a computer (including testing software), etc. Adopting A+A+A+class xenon lamp transient light source that meets the IEC60904-9:2020 standard, the irradiation intensity can be adjusted to 200-1200W/m2, and the equipment has temperature correction and light intensity correction functions, as well as monitoring of irradiance status.

This device can be used for measuring I-V curves, P-V curves, irradiance lines, short-circuit current, open circuit voltage, peak power, peak power point voltage, current, fill factor, conversion efficiency, series resistance, parallel resistance, and other parameters of conventional polycrystalline, monocrystalline PERC, TopCon, heterojunction, CIGS, GaAs, CdTe, and IBC battery components.

Xenon lamp pulse solar simulator (laboratory) parameter table:

reference standard	IEC60904-9:2020
Light source type	Xenon lamp pulse light source
spectral range	300-1200nm
Light source grade	Spectral matching degree 0.875-1.125 A+ Non-uniformity of irradiance ≤1% A+ Irradiance instability ≤1% A+
Range of irradiance	200W/㎡~1300W/㎡
Test area	2600*1600mm Customizable in other sizes
pulse width	10-100ms， Adjustable every 1ms step
Repeatability accuracy	≤0.1%
Testing Technology	Standard I-V and V-I scanning modes, integrated advanced hysteresis testing mode Sequential Approximation Testing (SAT), Intelligent Testing (IAT) Peak holding test function
Testable battery	Conventional polycrystalline Perc、Topcon、BC、 Heterojunction, CIGS, GaAs, CdTe and other battery components
Additional items that can be added	EL testing system, realizing IV/EL testing at the same workstation Temperature control system, implementing Panfile and temperature coefficient testing WPVS battery, achieving absolute measurement IAM rotating bracket enables measurement at different angles Low irradiance filter for low irradiance testing Multi channel temperature box for multi-point temperature measurement