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Shanghai Dilun Optical Instrument Co., Ltd

  • E-mail

    1163171717@qq.com

  • Phone

    13564000623

  • Address

    Building 4, Block B, No. 1999 Wuxing West Road, Shangyu District, Shaoxing City, Zhejiang Province

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XTL-330 Inverted Metallographic Microscope

NegotiableUpdate on 02/06
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Overview
The XTL-330 inverted metallographic microscope adopts a high-precision optical system and is equipped with a large field flat field eyepiece to assist material teaching and laboratory analysis. Equipped with coaxial coarse and micro focusing mechanism, easy to operate; The compact body design saves laboratory space, supports open field observation, and meets the needs of basic scientific research and teaching.
Product Details

XTL-330 Inverted Metallographic Microscope

1、 Product Introduction:

XTL-330 Inverted Metallographic MicroscopeAdopting a high-precision optical system, coupled with a large field of view flat field eyepiece, to assist in material teaching and laboratory analysis. Equipped with coaxial coarse and micro focusing mechanism, easy to operate; The compact body design saves laboratory space, supports open field observation, and meets the needs of basic scientific research and teaching.

2、 Performance characteristics:

1. Inverted optical path design: The objective lens is located below the stage, with the sample observation surface facing downwards, suitable for observing thick or hard to move samples (such as metal blocks, wafers, etc.), to avoid affecting imaging due to sample height limitations.2. High stability: The body is sturdy and designed to withstand earthquakes, reducing the impact of external vibrations on high magnification observations.

3Multi light source configurationplaceOptional observation methods such as bright field, dark field, polarization, etc. are available to meet the contrast requirements of different materials.

4Easy to operate, the eyepiece and operation interface conform to ergonomics, reducing fatigue from long-term use.

3、 Product specifications:

model

XTL-330

bright field/encoding/Light intensity memory/polarized light(optional)

optical system

Infinite chromatic aberration correction optical system45mm

trinocular observation tube

Infinite hinge three-way observation tube, pupil distance adjustment:50mm~75mm,Unilateral visual acuity adjustment:±5Refractive power, two spectral ratiosR:T=100:0or0:100

eyepiece

High eye point, large field of view, flat field eyepieceSWH10X23mm(Adjustable visual acuity)

objective lens

Mingchang metallographic objective lens

(5xThe10xThe20xThe50xThe100x)

5X NA0.15WD11.7The10X NA0.3WD13The20XNAO.40WD11.1The50X NA0.75WD3.6The100XNAO.8WD2.1(optional)

rack

Slot with polarizing device and light intensity memory function

Objective lens converter

5Kong manual coding type bright field objective lens converter

Encoding type objective lens converter combines the hardware settings of the microscope withCapture ProIntegrate image analysis software together. The magnification of the objective lens is displayed on the screen, and the calibration value recorded in the software can be automatically adjusted when switching magnification to prevent measurement errors caused by forgetting to switch software magnification.

Coarse and micro focusing mechanism

Using low hand position coarse adjustment coaxial, coarse adjustment stroke9mm,Focus upwards6.5mm,down2.5mm,Fine tuning accuracy0.002mm,Equipped with an elastic adjustment handwheel to prevent slipping

Carrier platform

Double layer mechanical mobile platform, tabletop215mm*165mm,Low hand positionXTheYDirection coaxial adjustment, movement stroke45*35mm

Camera interface

Photography and videography accessories:0.5X CInterface, adjustable focus;

Other optional attachments

4KHigh definition imaging systemUSB3.0Computer version imaging system, camera(500Wan600Wan1200Wan2000Wan Deng)

Optional accessories

High precision micrometer, grid value0.01mm

software(Professional measurement system, metallographic analysis system, particle analysis system, porosity analysis system, welding specific measurement system, etc)