X-ray emission spectrometer XEScope

X-ray emission spectrometer XEScopeIt is a characterization device that can quantitatively and qualitatively analyze the chemical state of elements. With accurate detection capabilities and convenient operating experience, it provides reliable technical support for the study of element valence states in multiple fields.

Ultra high sensitivity: can accurately capture low content (0.1 wt%) component information.

High energy resolution: ≤ 0.5 eV, precise signal recognition.

Chemical state resolution: Clearly distinguish different valence states of the same element (such as Si ²+/Si 4+, S ² -/S ⁶+), and analyze its chemical properties.

In situ testing: dynamic reaction mechanism research, precise reduction of in-situ characteristics of component distribution and chemical state changes.

● Wide coverage of elements: can analyze light elements (such as Al, Si) to heavy elements (such as U, Pb), meeting the needs of multiple fields.

Non destructive testing: No need to damage the sample structure, suitable for analysis of precious/rare samples.

User friendly interface: Integrated software, easy to operate and learn.

X-ray emission spectrometer XEScopeOverview

Focusing on surface valence state information, compatible with multiple sample morphologies

Accurate capture of surface information: The core focuses on the composition and chemical state of surface elements of the sample, without the need for deep penetration, directly obtaining key surface data, suitable for surface research scenarios such as coatings and films.

● Multi form sample without threshold: it is compatible with solid (such as block, sheet), liquid (such as solution, lotion), powder and other forms, without complex pre-treatment such as grinding and dissolution by customers, and can be directly tested on the machine.

● Low quantity and low content friendly: The sample demand is as low as 5 mg, and special forms such as small crystals and small amounts of powder can be adapted; Support sample testing with a quality score of 0.1%, with a wide range of testing capabilities.

Integrated software for precise quantitative analysis

● Convenient operation: It can achieve simplified operation throughout the entire process - from testing condition confirmation to actual data parsing without complex professional operations, user-friendly interface, and minimal training needs.

Integrated software: equipped with functional analysis software that supports automatic energy calibration, fitting analysis, and quantitative analysis. It also supports batch testing of multiple sets of samples corresponding to the same element. The software can calculate analysis results in batches and generate standardized reports, greatly improving detection efficiency.

Quantitative analysis of price state

Valence analysis: By using standard samples for energy calibration and quantitative shift of valence states, the valence state information of the test sample can be obtained

Proportion analysis: By linearly fitting the test sample and standard sample, the proportion of each valence state in the test sample can be calculated

Fully automated testing, covering a wide range of elements

Crystal automatic switching: Equipped with crystal automatic switching function, it can carry 6 analytical crystals and cover an energy range of 1.2 K eV-5 K eV.

● Wide coverage of elements: capable of performing valence state analysis on a wide range of elements with atomic numbers of 13 (Al) -23 (V) and 31 (Ga) -90 (U), with a detection range mainly including

The K spectral line of 13 (Al) -23 (V), the L spectral line of 31 (Ga) -59 (Pr), and the M spectral line of 61 (Pm) -90 (U) meet the diverse detection needs from light elements to heavy elements.

Comparison of characterization methods and features