Welcome Customer !

Membership

Help

Shanghai Pulangyuan Precision Electromechanical Co., Ltd
Custom manufacturer

Main Products:

instrumentb2b>Products
Product Categories

Shanghai Pulangyuan Precision Electromechanical Co., Ltd

  • E-mail

  • Phone

    18017373226

  • Address

    Room 703, South Building, Jinmao Garden, 2515 Pudong Avenue, Pudong New Area, Shanghai

Contact Now

TAYLOR HOBSON non-contact profilometer from the UK

NegotiableUpdate on 01/06
Model
Nature of the Manufacturer
Producers
Product Category
Place of Origin

Overview

TAYLOR HOBSON: The CCI Lite non-contact profilometer adopts the CCI (coherent correlation algorithm of brick technology) interference principle, which can measure surface morphology, surface roughness, three-dimensional and two-dimensional dimensions, surface defect detection and analysis with high accuracy, and generate statistical reports

Product Details

Taylor Hobson non-contact profilometer from the UK: The CCI Lite non-contact profilometer adopts the CCI (coherent correlation algorithm of Bricklay technology) interference principle, which can measure surface morphology, surface roughness, three-dimensional and two-dimensional dimensions, surface defect detection and analysis with high accuracy, and generate statistical reports;
TAYLOR HOBSON non-contact profilometer from the UK:
1. Shock absorber base and column:
Cast aluminum baseCombining air flotation shock absorption to improve measurement stability and repeatability accuracy
Steel structure columnImprove the robustness and stability of the measurement circuit, and reduce the impact of external vibrations
2. system parameter
(1)Interference type:CCIInterference, Taylor Hopson brick correlation algorithm
(2)Measurement range:2.2mm(Standard), data splicing is used for sizes greater than 10mm
(3)resolving power:0.1 A
(4) RMSRepeatability:<0.02nm
(5)Vertical scanning speed: 7 um/s
(6)Measurement points:1 1024 x 1024dot matrix
(7) X YSingle measurement range of shaft: 0.36-7.2 mm
(8) X YAxis resolution:0.4-0.6um
(9)Repeatability of step height:>0.1%
(10)System noise:<0.08nm
(11)Measurement time: Typical sample 5-20 seconds
(12) Reflectance of the tested component:0.3 –100%